Generative AI is changing the world - but can it continue to succeed with our current data infrastructure? By _Alphawave Semi May 25, 2023
Designing Smarter Edge AI Devices with the Award-Winning Synopsys ARC NPX6 NPU IP By _Synopsys Blog May 25, 2023
New Synopsys Report Highlights Key Industry Insights on the Impact of Multi-Die Systems By _Synopsys Blog May 24, 2023
Can the Semiconductor Industry Overcome Thermal Design Challenges in Multi-Die Systems? By _Synopsys Blog May 23, 2023
Cadence Collaboration with Kudan and Visionary.ai Enables Rapid Deployment of VSLAM and AI ISP-Based Solutions By _Cadence Blog May 22, 2023
Designing Chips in the Cloud: Four Key Takeaways from SNUG Silicon Valley 2023 By _Synopsys Blog May 22, 2023
How Multi-Die Systems Create New Business Opportunities for Semiconductor Companies By _Synopsys Blog May 19, 2023
Shifting left for success: Highlights from the Siemens EDA User 2 User conference By _Codasip Blog May 17, 2023
Expanded access to Arm Virtual Hardware for the entire IoT ecosystem By _arm - arm Blogs May 11, 2023
NAND Flash Memory - Key Element For Your Multi-Die Systems Verification - Part 1 By _Synopsys: VIP Experts Blog May 9, 2023
Pre and Post-Silicon Verification Have Never Been Closer! Leveraging Portable Stimulus for Automatic Test Equipment (ATE) By _Cadence Blog May 8, 2023