Pre and Post-Silicon Verification Have Never Been Closer! Leveraging Portable Stimulus for Automatic Test Equipment (ATE)
The initial focus of the Portable Test and Stimulus Standard (PSS) was pre-silicon verification – even if the community, from the beginning, envisioned re-using pre-silicon test content in post-silicon. In this blog post, we will cover new use cases with PSS toward ATE: i.e., Automated Test Equipment typically used in production tests.
The Challenge
The ever-increasing design complexity of technology nodes and new packaging technologies for digital devices has led to a new class of device failures and, consequently, new testing approaches and innovative thinking to overcome the time-to-market pressure of today. These new demands are observed in all value chain steps and push the once silo-based disciplines, such as pre-silicon verification and ATE, to work together.
On the ATE side, the typical production test content is currently dominated by structural tests. However, while the structural test is the foundation for systematic test coverage according to targeted fault models, there is a growing need for functional tests to reach high volume readiness. Accordingly, there is a trend for an increasing amount of functional tests – further amplified by the rising quality expectations in diverse applications (e.g., automotive, data center, high-margin consumer products).
To read the full article, click here
Related Semiconductor IP
- Bluetooth Low Energy 6.0 Digital IP
- Flash Memory LDPC Decoder IP Core
- SLM Signal Integrity Monitor
- Bluetooth Low Energy 6.0 Scalable RF IP
- All Digital Fractional-N RF Frequency Synthesizer PLL in GlobalFoundries 22FDX
Related Blogs
- Portable Stimulus: The Next Big Leap In SoC Verification
- High-Speed Test IO: Addressing High-Performance Data Transmission And Testing Needs For HPC & AI
- Evaluating Spatial Audio - Part 2 - Creating and Curating Content for Testing
- Why has the semicon equipment bubble really burst?
Latest Blogs
- MIPI: Powering the Future of Connected Devices
- ESD Protection for an High Voltage Tolerant Driver Circuit in 4nm FinFET Technology
- Designing the AI Factories: Unlocking Innovation with Intelligent IP
- Smarter SoC Design for Agile Teams and Tight Deadlines
- Automotive Reckoning: Industry Leaders Discuss the Race to Redefine Car Development