Agere licenses BIST technology from LogicVision to reduce test costs
Agere licenses BIST technology from LogicVision to reduce test costs
By Semiconductor Business News
June 4, 2002 (5:52 p.m. EST)
URL: http://www.eetimes.com/story/OEG20020604S0052
SAN JOSE -- LogicVision Inc. today announced that Agere Systems Inc. has licensed its built-in-self-test (BIST) technology for use in its chip lines. Under the agreement, Agere will use LogicVision's Embedded Test 4.0 for its hierarchical test design, debug and seamless integrated manufacturing test infrastructure. LogicVision's embedded test solution allows integrated circuit designers to embed test functionality into a semiconductor design. As part of the multi-year agreement, Agere will deploy Embedded Test 4.0 to its design groups, delivering time-to-market value by reducing design-for-test implementation and verification time.
Related Semiconductor IP
- eUSB2V2.0 Controller + PHY IP
- I/O Library with LVDS in SkyWater 90nm
- 50G PON LDPC Encoder/Decoder
- UALink Controller
- RISC-V Debug & Trace IP
Related News
- LogicVision calls on 'ET' 4.0 to lower test costs for SoCs
- Q-Star Test nv joins LogicVision Ready™ partner program to help further reduce test costs and enhance yield
- LogicVision Introduces Fastest Silicon Debug Saving Development Time and Resource Costs
- Agere Systems Announces Platform for Wireless Equipment that can Shave More Than $25 Million in Software Costs
Latest News
- Qualitas Semiconductor Secures Strategic IP Licensing Agreement for MIPI Solutions
- Chinese RISC-V Chipmaker SpacemiT Launches K3 AI CPU, Highlighting the Rise of Open-Source Hardware in Intelligent Computing
- Weebit Nano Q2 FY26 Quarterly Activities Report
- Arasan announces the immediate availability of the industries first xSPI NOR + eMMC NAND Combo PHY IP
- AMIQ EDA Gives AI Agents Access to Essential Design and Verification Data