The pitfalls of mixing formal and simulation: Where trouble starts
By Mark Eslinger, Joe Hupcey and Nicolae Tusinschi (Siemens EDA)
EDN (May 23, 2022)
The most effective functional verification environments employ multiple analysis technologies, where the strengths of each are combined to reinforce each other to help ensure that the device under test (DUT) behaves as specified. However, this creates an inherent challenge of properly comparing—and combining—the results from each source to give a succinct, accurate picture of the verification effort’s true status.
The most common problem we see is when design engineers want to merge the results from formal analysis with the results of RTL code and functional coverage from their UVM testbench, yet they don’t fully understand what formal coverage is providing. Hence, we will start on the familiar ground of simulation-generated code and functional coverage before going into defining formal coverage.
To read the full article, click here
Related Semiconductor IP
- UCIe Chiplet PHY & Controller
- MIPI D-PHY1.2 CSI/DSI TX and RX
- Low-Power ISP
- eMMC/SD/SDIO Combo IP
- DP/eDP
Related White Papers
- Colibri, the codec for perfect quality and fast distribution of professional AV over IP
- Paving the way for the next generation of audio codec for True Wireless Stereo (TWS) applications - PART 5 : Cutting time to market in a safe and timely manner
- Automotive Architectures: Domain, Zonal and the Rise of Central
- Capitalizing on the Architectural Flexibility of FPGAs with RISC-V and a Simplified Programming Flow
Latest White Papers
- Achieving Lower Power, Better Performance, And Optimized Wire Length In Advanced SoC Designs
- The pivotal role power management IP plays in chip design
- What tamper detection IP brings to SoC designs
- Analyzing Modern NVIDIA GPU cores
- RISC-V in 2025: Progress, Challenges,and What’s Next for Automotive & OpenHardware