Design, Test & Repair Methodology for FinFET-Based Memories
Dr. Yervant Zorian, Chief Architect and Fellow, Synopsys
The advent of FinFET-based memories presents new memory test challenges. This white paper covers the new design complexities, defect coverage and yield challenges presented by FinFET-based memories; how to synthesize test algorithms for detection and diagnosis of FinFET specific memory defects; and how incorporating built-in self-test (BIST) infrastructures with high-efficiency test and repair capabilities can help to ensure high yield for FinFET-based memories.
Related Semiconductor IP
- Ultra-Low-Power LPDDR3/LPDDR2/DDR3L Combo Subsystem
- 1G BASE-T Ethernet Verification IP
- Network-on-Chip (NoC)
- Microsecond Channel (MSC/MSC-Plus) Controller
- 12-bit, 400 MSPS SAR ADC - TSMC 12nm FFC
Related Articles
- Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip
- QiMeng: Fully Automated Hardware and Software Design for Processor Chip
- Physical Design Exploration of a Wire-Friendly Domain-Specific Processor for Angstrom-Era Nodes
- PCIe 5.0: The universal high-speed interconnect for High Bandwidth and Low Latency Applications Design Challenges & Solutions
Latest Articles
- Extending and Accelerating Inner Product Masking with Fault Detection via Instruction Set Extension
- ioPUF+: A PUF Based on I/O Pull-Up/Down Resistors for Secret Key Generation in IoT Nodes
- In-Situ Encryption of Single-Transistor Nonvolatile Memories without Density Loss
- David vs. Goliath: Can Small Models Win Big with Agentic AI in Hardware Design?
- RoMe: Row Granularity Access Memory System for Large Language Models