LogicVision and Dolphin Technology partner on embedded test

LogicVision Uses Dolphin Technology Memory and Libraries in Corporate Training Material
 

San Jose, Calif., April 22, 2002 - LogicVision, Inc., (NASDAQ:LGVN), a leading provider of embedded test IP for integrated circuits and systems, today launched a broad partnership with Dolphin Technology, Inc., a provider of performance-optimized SoC memory cores and performance-matched standard cell libraries and Input/Outputs (IOs).

The partnership between Dolphin and LogicVision will enable tighter integration of memory and logic library SoC design elements with embedded test SoC design techniques. LogicVision and Dolphin are planning for an integrated, self-test and repairable memory capability for Dolphin's high-performance memory offerings. As part of the agreement, Dolphin's performance memory cores and standard cell libraries will become the standard design elements in LogicVision's IP training and tutorial material.

"By launching this partnership with LogicVision, we're able to provide a comprehensive performance solution to our customers," said Mo Tamjidi, president of Dolphin. "Our customers deploy Dolphin's performance products in designs which require reliability. With LogicVision, we can deliver further on those requirements."

"Our partnership with Dolphin represents a major step toward fully integrated memory cores and library SoC design elements with embedded test," noted Mukesh Mowji, vice president of marketing at LogicVision. "As a result of this collaboration, we expect to offer our mutual customers the opportunity to acquire performance-optimized, high-quality design elements for very dense, highly complex SoC designs. We look forward to the growth of this partnership and the benefits that it will bring to our customers."

About Dolphin Technology

 Dolphin Technology, Inc., is a leading provider of high performance Semiconductor Intellectual Property (SIP) blocks that include embedded memory and memory compiler products, high performance and standard IOs and high performance standard cell libraries.

Advanced design technology incorporated into Dolphin's SIP blocks enable SOC (System on Chip) designs to achieve faster clock rates, smaller die size and reduced manufacturing cost. For more information about Dolphin and its products, please visit www.dolphin-ic.com.

About LogicVision Inc.

LogicVision (NASDAQ: LGVN) provides proprietary technologies for embedded test that enable the more efficient design and manufacture of complex semiconductors. LogicVision's embedded test solution allows integrated circuit designers to embed into a semiconductor design test functionality that can be used during semiconductor production and throughout the useful life of the chip. For more information on the company and its products, please visit the LogicVision Web site at www.logicvision.com.

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Forward-Looking Statements

Except for the historical information contained herein, the matters set forth in this press release, including statements as to the expected results, growth and benefits of the companies' partnership, including enabling tighter integration of memory and logic library SoC design elements with embedded test SoC design techniques, an integrated, self-test and repairable memory capability for Dolphin's high-performance memory offerings and offering customers the opportunity to acquire performance-optimized, high-quality design elements for very dense, highly complex SoC designs, are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risks and uncertainties that could cause actual results to differ materially, including, but not limited to, the ability of the companies to integrate their technologies, the impact of technological advances, and other risks detailed in LogicVision's Form 10-K for the year ended December 31, 2002 and from time to time in LogicVision's SEC reports. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward-looking statements.

LogicVision, Embedded Test, LogicVision Ready and LogicVision logos are trademarks or registered trademarks of LogicVision Inc. in the United States and other countries. All other trademarks and service marks are the property of their respective owners.

Acronyms and Definitions

ATE: Automatic Test Equipment
ATPG: Automatic Test Pattern Generation
BIST: Built-in-Self-TestDFT: Design-for-Test
DFT: Design-for-Test
EDA: Electronic Design Automation
GDSII: An industry format describing the physical structure of the chip design and used to create mask tooling for chip manufacturing
GUI: Graphics User Interface
HDL: Hardware Description Language
IC: Integrated Circuit
RTL: Register Transfer-Level
Verilog: A hardware description language used to design and document electronic systems.
VHDL: VHSIC (Very High-Speed Integrated Circuit) HDL
IP: Intellectual Property
SoC: System-on-chip