iSTART-TEK Obtained U.S. Patent, “Configurable Testing and Repair System for Non-Volatile Memory”
July 14, 2025 -- iSTART-TEK is proud to announce that we have been granted a U.S. invention patent for our “Configurable Testing and Repair System for Non-Volatile Memory”, reinforcing our leadership in advanced memory test and repair technologies.
This patented system enables a configurable flow that includes:
- A memory testing device to determine whether a memory requires repair and to generate diagnostic defect data (fault address and fault value)
- A memory repair device that executes repair based on diagnostic results
- A control unit that orchestrates both testing and repair operations seamlessly
This innovation empowers iSTART-TEK to deliver more reliable, efficient, and flexible memory test solutions for our global partners.
Related Semiconductor IP
- HBM4 PHY IP
- Ultra-Low-Power LPDDR3/LPDDR2/DDR3L Combo Subsystem
- MIPI D-PHY and FPD-Link (LVDS) Combinational Transmitter for TSMC 22nm ULP
- HBM4 Controller IP
- IPSEC AES-256-GCM (Standalone IPsec)
Related News
- Andes and Arculus System Collaborate to Integrate iPROfiler™ into AndeSysC, Expanding Virtual Platform Support for RISC-V SoC Design
- GBT Filed a Continuation Patent Application for its Long-Range Radio System
- Non-Volatile Memory: What Will 2023 Bring?
- Cadence Advances AI in the Cloud with Industry-First DDR5 12.8Gbps MRDIMM Gen2 Memory IP System Solution
Latest News
- AI Directs UFS Advancement
- Qualitas Semiconductor Expands Automotive Momentum with 5nm IP Bundle Agreement
- Cyient Semiconductors Acquires Majority Stake in Kinetic Technologies to Drive Custom Power IC Leadership for Edge AI and High-Performance Compute Markets
- Rivian Unveils Custom Silicon, Next-Gen Autonomy Platform, and Deep AI Integration
- NanoXplore raises €20 million from MBDA and Bpifrance to accelerate its diversification into defense and its growth in support of European strategic sovereignty