iSTART-TEK Obtained U.S. Patent, “Configurable Testing and Repair System for Non-Volatile Memory”
July 14, 2025 -- iSTART-TEK is proud to announce that we have been granted a U.S. invention patent for our “Configurable Testing and Repair System for Non-Volatile Memory”, reinforcing our leadership in advanced memory test and repair technologies.
This patented system enables a configurable flow that includes:
- A memory testing device to determine whether a memory requires repair and to generate diagnostic defect data (fault address and fault value)
- A memory repair device that executes repair based on diagnostic results
- A control unit that orchestrates both testing and repair operations seamlessly
This innovation empowers iSTART-TEK to deliver more reliable, efficient, and flexible memory test solutions for our global partners.
Related Semiconductor IP
- 12-bit, 400 MSPS SAR ADC - TSMC 12nm FFC
- UCIe PHY (Die-to-Die) IP
- UCIe-S 64GT/s PHY IP
- UA Link DL IP core
- 10-bit Pipeline ADC - Tower 180 nm
Related News
- Andes and Arculus System Collaborate to Integrate iPROfiler™ into AndeSysC, Expanding Virtual Platform Support for RISC-V SoC Design
- GBT Filed a Continuation Patent Application for its Long-Range Radio System
- Non-Volatile Memory: What Will 2023 Bring?
- Cadence Advances AI in the Cloud with Industry-First DDR5 12.8Gbps MRDIMM Gen2 Memory IP System Solution
Latest News
- DCD-SEMI Unveils Ultra-Fast DAES IP Core for AES Encryption
- MosChip Collaborates with EMASS on Silicon Implementation for its Breakthrough Edge AI SoC
- Innatera and 42T join forces to power the next wave of intelligent product innovation
- UMC and Polar Collaborate to Meet Growing Demand for U.S. Onshore Semiconductor Manufacturing
- Certus Semiconductor adopts AI-powered Solido to accelerate IO library, analog IP and ESD development