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- 12nm
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Advanced On-Die DroopTelemetry
- Programmable
- Process Portable
- Silicon Lifecycle Analytics
-
Process/Voltage/ Temperature Sensor
- Area: 0.088mm2 (200um x 440um) including IO and ESD
- Up to 100KS/s sampling rate
- Process corner detection for TT/FF/SS on RVT devices
- Support temperature and voltage measurement