Advanced On-Die DroopTelemetry

Overview

The Aeonic Insight Droop Detector is used as part of the Movellus Integrated Droop Response System comprised of the Aeonic Insight Droop Detector and the Aeonic Generate AWM3. In combination, these two blocks comprise a closed loop droop detection and response system. The detector can also be independently used to characterize droop profiles and power delivery network (PDN) behavior.

It is a multi-threshold sensor that is a part of the Aeonic digital IP platform. Designed for high reliability and accuracy, the droop detector provides extensive observability and configurability of droop event detection and thresholds.

Key Features

  • Programmable
    • Aeonic Insight sensors are programmable to help design teams tailor sensor operations to suit specific architecture, workloads, and environmental conditions.
  • Process Portable
    • Aeonic Insight sensors are process portable and efficiently scale across advanced process technologies. The digital architecture also ensures that features reliably port from node-to-node and support long-term R&D leverage.
  • Silicon Lifecycle Analytics
    • Aeonic Insight sensors generate advanced on-die telemetry for silicon lifecycle analytic platforms. These metrics provide design teams a new vantage point for power grid optimization, clock management, and hardware security incursions. Insight sensors are equipped with industry-standard interfaces for simplified integration into 3rd party platforms.

Technical Specifications

Availability
Available Now
GLOBALFOUNDRIES
Pre-Silicon: 12nm , 14nm , 14nm LPE , 14nm LPP , 20nm LPM , 22nm , 22nm FDX , 28nm , 28nm FDSOI , 28nm HPP , 28nm LPH , 28nm SLP
Intel Foundry
Pre-Silicon: 18A , 3nm , 16nm
SMIC
Pre-Silicon: 14nm
Samsung
Pre-Silicon: 4nm , 5nm , 7nm , 8nm , 10nm , 11nm , 14nm
TSMC
Pre-Silicon: 3nm , 4nm , 5nm , 6nm , 7nm , 10nm , 12nm , 16nm , 20nm , 22nm , 28nm , 28nm HP , 28nm HPC , 28nm HPCP , 28nm HPL , 28nm HPM , 28nm LP
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Semiconductor IP