A brief primer on embedded SoC packaging options
Deepak Behera, Sumit Varshney, Sunaina Srivastava, and Swapnil Tiwari, Freescale Semiconductor
11/20/2011 9:16 PM EST
With shrinking technology, voltage levels are being reduced, lowering noise margins required to enable a clean design from a signal integrity perspective. Higher operating frequency requirements further complicate design closure. Semiconductor packages are a quintessential piece of the signal integrity puzzle.
This article addresses the basics of packaging such as types of packages and their advantages and disadvantages, future trends, and factors to be considered while choosing a package.
To read the full article, click here
Related Semiconductor IP
- Bluetooth Low Energy 6.0 Digital IP
- Ultra-low power high dynamic range image sensor
- Flash Memory LDPC Decoder IP Core
- SLM Signal Integrity Monitor
- Digital PUF IP
Related White Papers
- An Efficient Device for Forward Collision Warning Using Low Cost Stereo Camera & Embedded SoC
- Testing Of Repairable Embedded Memories in SoC: Approach and Challenges
- Internal JTAG - A cutting-edge solution for embedded instrument testing in SoC: Part 1
- Internal JTAG - A cutting-edge solution for embedded instrument testing in SoC: Part 2
Latest White Papers
- How Next-Gen Chips Are Unlocking RISC-V’s Customization Advantage
- Efficient Hardware-Assisted Heap Memory Safety for Embedded RISC-V Systems
- Automatically Retargeting Hardware and Code Generation for RISC-V Custom Instructions
- How Mature-Technology ASICs Can Give You the Edge
- Exploring the Latest Innovations in MIPI D-PHY and MIPI C-PHY