SRAM PUF: A Closer Look at the Most Reliable and Most Secure PUF By Geert-Jan Schrijen, Intrinsic ID April 6, 2020
NeoPUF, A Reliable and Non-traceable Quantum Tunneling PUF By Charles Hsu, PUFsecurity March 30, 2020
Shift Power Reduction Methods and Effectiveness for Testability in ASIC By Saumil Modi, eInfochips March 16, 2020
Improving performance and security in IoT wearables By Pritesh Mandaliya, Cypress Semiconductor March 12, 2020
Internal JTAG - A cutting-edge solution for embedded instrument testing in SoC: Part 2 By Medha Thakar, eInfochips - An Arrow Company March 9, 2020
Strategy To Fix Register-to-Register Timing For large Feedthrough Blocks Having Limited Internal Pipelines By Ankita Bhaskar, An Arrow Company) March 5, 2020
Interface Timing Challenges and Solutions at Block Level By Manish Kumar Sagarvanshi , eInfochips - An Arrow Company January 27, 2020
Understanding Shmoo Plots and Various Terminology of Testers By Esha Pal, eInfochips, an Arrow company January 6, 2020
Why the Memory Subsystem is Critical in Inferencing Chips By Geoff Tate, Flex Logix December 23, 2019
Formal-based methodology cuts digital design IP verification time By David Vincenzoni, STMicroelectronics December 11, 2019
Internal JTAG - A cutting-edge solution for embedded instrument testing in SoC: Part 1 By Medha Thakar, eInfochips, an Arrow company December 9, 2019
Pyramid Vector Quantization and Bit Level Sparsity in Weights for Efficient Neural Networks Inference By Vincenzo Liguori , Ocean Logic November 28, 2019