How to test carrier aggregation in LTE-Advanced networks
Dr. Stamatis Georgoulis Aeroflex Test Solutions
6/27/2012 8:28 AM EDT
For LTE-Advanced, 3GPP Release 10 introduced several new features to augment the existing LTE standard, and these are aimed at raising the peak downlink data rate to 1 Gbps and beyond, as well as reducing latency and improving spectrum efficiency. Targets have also been set enabling the highest possible cell edge user throughput to be achieved.
If the high data rate targets are to be met, LTE-Advanced will require a channel bandwidth that is much wider than the 20 MHz currently specified for LTE. This will not be possible with just a single carrier in the limited spectrum bands available to most operators. Consequently, carrier aggregation—the ability to combine multiple carriers scattered around the spectrum—will be a key measure to achieve the wider effective bandwidth that will be required, typically up to 100 MHz. This means that multiple carriers comprised of either contiguous or non-contiguous spectrum need to be added together to allow these wider channel bandwidths—and thus faster data rates—to be achieved.
Implementing carrier aggregation in a network will mean that operators and infrastructure vendors will require a test mobile equipped with carrier aggregation, ahead of real mobile terminals becoming available.
To read the full article, click here
Related Semiconductor IP
- 1.8V/3.3V I/O library with ODIO and 5V HPD in TSMC 16nm
- 1.8V/3.3V I/O Library with ODIO and 5V HPD in TSMC 12nm
- 1.8V to 5V GPIO, 1.8V to 5V Analog in TSMC 180nm BCD
- 1.8V/3.3V GPIO Library with HDMI, Aanlog & LVDS Cells in TSMC 22nm
- Specialed 20V Analog I/O in TSMC 55nm
Related White Papers
- Test engineers must join ASIC flow early
- SoC Test and Verification -> Assertions speed processor core verification
- SoC Test and Verification -> Leveraging memory for better fault tolerance
- SoC Test and Verification -> ATE struggles to keep pace with VLSI