LogicVision Announces New Generation of Embedded Memory Test and Yield Learning Solutions to Meet the Growing Challenges of Advanced Technology Nodes

SAN JOSE, Calif. — June 5, 2006 — LogicVision, Inc. (NASDAQ: LGVN), today announced the availability of ETMemory, its newest generation of embedded memory test and yield capabilities specifically targeted at chips designed at advanced technology nodes. ETMemory, is the culmination of over a decade of embedded memory test development and refinement and provides the most robust and field proven embedded memory test and diagnostic capabilities in the industry.

To achieve the highest quality levels at the denser technology nodes, support for both hard and soft programmability allows user defined algorithms to be either integrated into embedded test controllers at design time or downloaded into embedded test controllers at test time. Hard programmability achieves high quality levels with low area overhead, while soft programmability provides the ability to handle unforeseen defect mechanisms during production, enabling quality without costly re-spins.

In addition, growing embedded memory sizes and densities are driving the need for increasing levels of memory redundancy to ensure good memory yields. ETMemory, provides fast on-chip memory repair analysis as well as on-chip memory self-repair to fully support these growing redundancy requirements.

ETMemory, includes LogicVision’s comprehensive automation suite that provides test rule checking, test planning, integration and verification all at the RT level. It also includes LogicVision’s ETProduction capability which allows the encapsulation of fail datalog functionality into a dynamically linked library (DLL) that is linked directly into the user test program. ETMemory can be custom tailored to a customer’s specific test and yield needs, offering multiple options to the robust base solution. Flexible options include post-silicon programmability, repair analysis and automated self-repair.

"As the market leader in memory test, we continue to push to define the state-of-the-art in embedded memory testing, taking it beyond identifying failures to automated repair and analysis,” said Jim Healy, president and CEO for LogicVision. "This technology allows designers to reap the benefits of nanometer design technology, with less risk of memory failures."

Pricing and availability

ETMemory, is available immediately, and will be on display at the upcoming Design Automation Conference, July 24-28 in San Francisco, California. ETMemory, works seamlessly with other LogicVision tools and is interoperable with all major physical design flows, including Cadence Design Systems, Magma Design Automation, and Synopsys.

About LogicVision Design-for-Test Tools

LogicVision is the market leader in Built-In-Self-Test (BIST) solutions, with a comprehensive suite of advanced embedded test capabilities, including ATPG, memory, logic, boundary-scan, SerDes, PLL and board-level solutions. Central to LogicVision’s offering is a powerful RT-level automation flow that ensures easy and successful integration of embedded test capabilities with minimal impact to the design flow and schedule.

LogicVision, Inc. provides unique yield learning capabilities in the design for manufacturing space. These capabilities enable its customers, leading semiconductor companies, to more quickly and efficiently learn to improve product yields. The company’s advanced Design for Test (DFT) product line, ETCreate, works together with ETAccess and SiVision yield learning applications to improve profit margins by reducing device field returns, reducing test costs, and accelerating both time to market and time to yield. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. LogicVision was founded in 1992 and is headquartered in San Jose, Calif. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.