Process Monitor IP
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Process monitor and Temperature Sensor, +/-3C Accuracy without Trimming - TSMC 22nm
- Process monitor and Temperature Sensor, +/-3C Accuracy without Trimming;
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Process Monitor
- Integration Flexibility: Easily integrates with other IPs and system-level components for comprehensive process management
- Adaptive Control: Enables dynamic adjustments to operating conditions based on real-time data, improving performance and reliability
- User-Friendly Interface: Offers an intuitive interface for easy configuration and monitoring
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Process Monitor
- Monitors process of Regular threshold voltage (RVT), Thick oxide (TD), High threshold voltage (HVT) devices. It monitors the process of Resistor and Capacitor as well.
- Digital supply Voltage range is from 0.9V to 1.1V, typical voltage is 1V.
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TSMC 28HPC+ Process Monitor
- Supply 0.9V
- SVT, HVT and ULVT P and N devices
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Ultra-Low-Power Process, Voltage, and Temperature Monitor in 3nm
- The ODT-PVT-ULP-001C-3nm is an ultra-low power temperature, voltage and process monitor designed in a 3nm CMOS process.
- This IP operates over the entire temperature range of -40°C to 150°C.
- The temperature monitor achieves ±4C temperature accuracy without trim and ±1C temperature accuracy after a single room temperature trim.
- The voltage monitor supports four differential or singleended inputs with a voltage range up to ±0.75V.
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Process Detector (For DVFS and monitoring process variation), TSMC N3E
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
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Process Detector (For DVFS and monitoring process variation), TSMC N4P
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
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Process Detector (For DVFS and monitoring process variation), TSMC N3
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
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Process Detector (For DVFS and monitoring process variation), TSMC 28HPC+
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted