CT23301 provides means to determine the process corner speed of some pre-defined MOS devices in the TSMC 28n technology node.
The process corner (fast or slow) can be evaluated using the measured output value of CT23301 to calculate the frequency result, which has to be compared with a defined table.
The IP has been designed to have the capability of monitoring both core NMOS or PMOS process corner for the ultra-low Vt, standard Vt and high Vt devices.
The ring oscillators (one for each of the selected DUTs) are connected to digital part which is composed of 2 counters and a finite-state machine (FSM), which enables the oscillator of the device under test (DUT) and properly controls the counters to perform the frequency measure of the selected oscillator.
The output result is a value proportional to the frequency of the DUT oscillator.
28n-TSMC Process Monitor
Overview
Key Features
- Supply 0.9V
- SVT, HVT and ULVT P and N devices
Benefits
- PVT characterized
- Easy portability
- In mass-production
Block Diagram
Applications
- General Purposes IP
Deliverables
- Datasheet
- Integration guidelines
- GDS2 and LVS Netlist
- Footprint (.LEF)
- Test Specifications
Technical Specifications
Maturity
Silicon-Proven on 28HPC+ TSMC technology
Availability
Available
Related IPs
- PVT - Process, Voltage, and Temperature Monitor - TSMC 16nm
- PVT - Process, Voltage, and Temperature Monitor TSMC 7nm
- 28n-TSMC Leakage Monitor
- In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC 28HPC+
- Process Detector (For DVFS and monitoring process variation), TSMC N3
- In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N3