Sensor IP for TSMC
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Sensor IP
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48
Sensor IP
for TSMC
from 9 vendors
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10)
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Voltage Glitch Sensor TSMC
- Minimum Glitch Detection: Typ <3ns1
- Positive & Negative Voltage Glitch Detection
- Programmable Glitch Threshold
- Optional Hysteresis to avoid false triggers in noisy environments
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Temperature Sensor TSMC
- Measurement Range: -20°C to +100°C
- Accuracy (Uncalibrated) +/-5°C
- Accuracy (Calibrated)
- -20°C to +100°C = +/-2°C
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Advanced On-Die DroopTelemetry
- Programmable
- Process Portable
- Silicon Lifecycle Analytics
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PVT Sensor TSMC 40G
- High precision, trimmed and untrimmed
- Low operational power, low leakage
- Simple digital interface
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Voltage Monitor with Digital Output, TSMC N7
- Accurately measures core supply domain and IO voltages
- Measurement of supply ranges up to 1.5V (with Prescaler)
- Measurement of IR drops between supply pins and critical blocks
- Digital interface for simplified chip integration
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Process Detector (For DVFS and monitoring process variation), TSMC N7
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
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Process Detector (For DVFS and monitoring process variation), TSMC 12FFC
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
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Voltage Monitor with Digital Output (Multi-domain supply monitoring), TSMC N3E
- Accurately measures core supply domain and IO voltages
- Measurement of supply ranges up to 1.5V (with Prescaler)
- Measurement of IR drops between supply pins and critical blocks
- Digital interface for simplified chip integration
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Process Detector (For DVFS and monitoring process variation), TSMC N3E
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
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Voltage Monitor with Digital Output (Multi-domain supply monitoring), TSMC N4P
- Accurately measures core supply domain and IO voltages
- Measurement of supply ranges up to 1.5V (with Prescaler)
- Measurement of IR drops between supply pins and critical blocks
- Digital interface for simplified chip integration