Industry Leaders Discuss "Overcoming the Challenges of Multi-die Systems Verification"
Lauro Rizzatti, hardware-assisted verification consultant, served as moderator for a well-attended and lively 2024 DVCon U.S. panel discussion on the challenges in multi-die systems verification.
The hour-long session featured panelists Alex Starr, AMD Corporate Fellow; Bharat Vinta, Director of HW Engineering at Nvidia; Divyang Agrawal, Sr. Director of RISC-V Cores at Tenstorrent; and Arturo Salz, Synopsys Fellow.
What follows is a shortened panel transcript, edited for readability.
To read the full article, click here
Related Semiconductor IP
- NFC wireless interface supporting ISO14443 A and B with EEPROM on SMIC 180nm
- DDR5 MRDIMM PHY and Controller
- RVA23, Multi-cluster, Hypervisor and Android
- HBM4E PHY and controller
- LZ4/Snappy Data Compressor
Related Blogs
- Industry Leaders Discuss "Overcoming the Challenges of Multi-die Systems Verification"
- Overcoming USB Type-C Verification Challenges
- NAND Flash Memory - Key Element For Your Multi-Die Systems Verification - Part 1
- Can the Semiconductor Industry Overcome Thermal Design Challenges in Multi-Die Systems?
Latest Blogs
- lowRISC Tackles Post-Quantum Cryptography Challenges through Research Collaborations
- How to Solve the Size, Weight, Power and Cooling Challenge in Radar & Radio Frequency Modulation Classification
- Programmable Hardware Delivers 10,000X Improvement in Verification Speed over Software for Forward Error Correction
- The Integrated Design Challenge: Developing Chip, Software, and System in Unison
- Introducing Mi-V RV32 v4.0 Soft Processor: Enhanced RISC-V Power