Moore’s Law and 40nm Yield
To follow up one of my most popular blogs TSMC 40nm Yield Explained!, here is a closer look at the 40nm yield issues that currently plague the semiconductor industry. It’s a direct result of Moore’s Law, the climbing transistor count and shrinking geometries. It’s a process AND design issue and the interaction is at the transistor level.
Related Semiconductor IP
- CAN XL Verification IP
- Rad-Hard GPIO, ODIO & LVDS in SkyWater 90nm
- 1.22V/1uA Reference voltage and current source
- 1.2V SLVS Transceiver in UMC 110nm
- Neuromorphic Processor IP
Related Blogs
- Moore's Law and 28nm Yield
- Blogging from Taiwan: TSMC and 40nm Yield
- TSMC 40nm Yield Explained!
- Moore's (Empirical Observation) Law!
Latest Blogs
- Analog Design and Layout Migration automation in the AI era
- UWB, Digital Keys, and the Quest for Greater Range
- Building Smarter, Faster: How Arm Compute Subsystems Accelerate the Future of Chip Design
- MIPS P8700 RISC-V Processor for Advanced Functional Safety Systems
- Boost SoC Flexibility: 4 Design Tips for Memory Subsystems with Combo DDR3/4 Interfaces