Boot Testing for Flash Usability
If non-volatile flash memory (NVMe) is to be considered for commercial client and mobile devices, then boot time will be critical. Here's how to test it.
Non-volatile flash memory (NVMe) has been used to increase the performance of high-end servers for years, notably pioneered by Fusion IO. Today, NVMe is becoming the preferred technology for flash storage and the all-flash datacenter. As NVMe adoption increases, other elements of usability will allow this technology to increase its reach beyond the datacenter, including its use as a boot device.
To read the full article, click here
Related Semiconductor IP
- JESD204E Controller IP
- eUSB2V2.0 Controller + PHY IP
- I/O Library with LVDS in SkyWater 90nm
- 50G PON LDPC Encoder/Decoder
- UALink Controller
Related Blogs
- High-Speed Test IO: Addressing High-Performance Data Transmission And Testing Needs For HPC & AI
- Maximizing the Usability of Your Chip Development: Design with Flexibility for the Future
- PCIe 6.x: Synopsys IP Selected as First Gold System for Compliance Testing
- Cadence support for the Open NAND Flash Interface (ONFI) 3.0 controller and PHY IP solution + PCIe Controller IP opening the door for NVM Express support
Latest Blogs
- A Low-Leakage Digital Foundation for SkyWater 90nm SoCs: Introducing Certus’ Standard Cell Library
- FPGAs vs. eFPGAs: Understanding the Key Differences
- UCIe D2D Adapter Explained: Architecture, Flit Mapping, Reliability, and Protocol Multiplexing
- RT-Europa: The Foundation for RISC-V Automotive Real-Time Computing
- Arm Flexible Access broadens its scope to help more companies build silicon faster