Avoiding Redundant Simulation Cycles for your UVM VIP with a Simple Save-Restore Strategy
January 6, 2015
In many verification environments, we reuse the same configuration cycles across different testcases. These cycles may involve writing and reading from different configuration and status registers, loading program memories, and other similar tasks to set up a DUT for its targeted stimulus. In many such environments, the time taken during these configuration cycles is very long. Also, there is a lot of redundancy as verification engineers have to run the same set of verified configuration cycles for different testcases leading to a loss in productivity. This is especially true for complex verification environments with multiple interfaces which require different components to be configured.
To read the full article, click here
Related Semiconductor IP
- Specialized Video Processing NPU IP for SR, NR, Demosaic, AI ISP, Object Detection, Semantic Segmentation
- Ultra-Low-Power Temperature/Voltage Monitor
- Multi-channel Ultra Ethernet TSS Transform Engine
- Configurable CPU tailored precisely to your needs
- Ultra high-performance low-power ADC
Related Blogs
- Interactive Debugging: Reduce Your Simulation Debug Turn-Around-Time
- Unlock early software development for custom RISC-V designs with faster simulation
- Analog Bits Steals the Show with Working IP on TSMC 3nm and 2nm and a New Design Strategy
- Skymizer Reduces Verification Cycles for AI Accelerator IP Development by 33% with Synopsys HAPS Prototyping
Latest Blogs
- Silicon Insurance: Why eFPGA is Cheaper Than a Respin
- One Bit Error is Not Like Another: Understanding Failure Mechanisms in NVM
- Introducing CoreCollective for the next era of open collaboration for the Arm software ecosystem
- Integrating eFPGA for Hybrid Signal Processing Architectures
- eUSB2V2: Trends and Innovations Shaping the Future of Embedded Connectivity