How flash-based FPGAs simplify functional safety requirements
Ted Marena, Microsemi
embedded.com (June 19, 2018)
As the quantity of industrial equipment controlled by electronics grows, so do concerns over the equipment failing and causing personal harm and property damage. Safety functions are built into equipment to prevent functional failure and ensure that if a system does fail, it fails in a nonharmful way. Examples of safety systems in industrial equipment include train breaks, sensors monitoring hazards to air quality or the physical environment, assembly line assistance robots, and distributed control in process automation equipment, just to name a few. These systems often include field programmable gate arrays (FPGAs) that, when supported by safety data packages for calculating failure rates, can play a pivotal role in streamlining safety assessments. When these devices are also flash-based and therefore immune to single event upsets (SEUs), FPGAs enable safety system developers to dramatically simplify their designs.
To read the full article, click here
Related Semiconductor IP
- Process/Voltage/Temperature Sensor with Self-calibration (Supply voltage 1.2V) - TSMC 3nm N3P
- USB 20Gbps Device Controller
- SM4 Cipher Engine
- Ultra-High-Speed Time-Interleaved 7-bit 64GSPS ADC on 3nm
- Fault Tolerant DDR2/DDR3/DDR4 Memory controller
Related White Papers
- FPGAs & Functional Safety in Industrial Applications
- How NoCs ace power management and functional safety in SoCs
- CAST Provides a Functional Safety RISC-V Processor IP for Microchip FPGAs
- How to use FPGAs to develop an intelligent solar tracking system
Latest White Papers
- Fault Injection in On-Chip Interconnects: A Comparative Study of Wishbone, AXI-Lite, and AXI
- eFPGA – Hidden Engine of Tomorrow’s High-Frequency Trading Systems
- aTENNuate: Optimized Real-time Speech Enhancement with Deep SSMs on RawAudio
- Combating the Memory Walls: Optimization Pathways for Long-Context Agentic LLM Inference
- Hardware Acceleration of Kolmogorov-Arnold Network (KAN) in Large-Scale Systems