JESD204B Tx-Rx PHY IP, Silicon Proven in UMC 28HPC

Overview

The JESD204B.01 version specification is compatible with the JESD204B Tx-Rx PHY IP interface, which offers complete support for the JESD204B synchronous serial interface. It gives a variety of inexpensive devices a straightforward interface because to its interoperability. In addition to offering solo Tx and Rx, the JESD204B PHY includes full complete transceiver capabilities.

Key Features

  • Multiple lanes transceiver with data rate from 1Gbps to 16Gbps: Transceiver version including both receiver and transmitter
  • Transmitter only version available
  • 40bit/32bit/20bit/16bit selectable parallel data bus Independent per-lane power down control
  • Programmable transmit amplitude
  • Programmable 3-tap feed forward equalizer (FFE)
  • Embedded receiver equalization (CTLE and DFE) to compensate insertion loss
  • Build in self-test with multiple pattern generation and checker for production test
  • Flexible reference clock frequency range
  • Integrated LC-tank PLL and Ring OSC PLL
  • Integrated on-chip differential 100-ohm termination for reference clock
  • Low capacitance ESD structures
  • Integrated on-chip differential 100 ohm termination in TX and RX:
  • Termination resistance auto calibration function (optional)
  • Support both Flip Chip Package and Wire Bonding Package
  • Testability: High Testability
  • Built-in pattern generator and checker including PRBS Internal serial loopback
  • Reliability: Lifetime: 10 years
  • Lifetime Average Temperature: up to 110 degC (include hot-spot)
  • Availability: 100%
  • ESD (HBM): over 2000V
  • ESD (CDM): over 250V
  • Latch-up: Satisfy JESD78 ClassII (Tj=125c), >100mA
  • Silicon Proven in UMC 28nm HPC

Benefits

  • Low Power Consumption
  • Low Physical Area compared to market standard
  • Operating Temperature: ~ 110degrees
  • Layered and Structured architecture

Deliverables

  • Application Note / User Manual
  • Behavior model, and protected RTL codes
  • Protected Post layout netlist and Standard
  • Delay Format (SDF)
  • Frame view (LEF)
  • Metal GDS (GDSII)
  • Test patterns and Test Documentation

Technical Specifications

Maturity
In Production
Availability
Immediate
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Semiconductor IP