The Growing Importance of PVT Monitoring for Silicon Lifecycle Management
In an era defined by complex chip architectures, ever-shrinking technology nodes and very demanding applications, Silicon Lifecycle Management (SLM) has become a foundational strategy for optimizing performance, reliability, and efficiency across the lifespan of a semiconductor device. Central to effective SLM are Process, Voltage, and Temperature (PVT) monitors—silicon-proven, highly accurate sensors embedded into chips to provide real-time, in-silicon visibility. As devices grow in complexity and adopt technologies like 2.5D/3D IC packaging, GAA (Gate-All-Around), and BSP (Backside Power), traditional design-time assumptions and margining techniques are no longer sufficient. PVT monitoring is now indispensable for ensuring that chips operate efficiently, safely, and predictably under real-world conditions.
At the recent IPSoC Conference in Silicon Valley, Rohan Bhatnagar gave a talk on the growing importance of PVT Monitoring for effective SLM. Rohan is the product manager for Synopsys’s SLM PVT Monitor IPs. A synthesis of the salient points from his talk follows.
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Related Semiconductor IP
- In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N3E
- PVT Controller (Series 5) (Sub-system for complete PVT monitoring), TSMC N3E
- In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N6
- In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC 12FFC
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