PVT Subsystem IP
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131
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PVT Sensor Subsystem
- Start-up time: Typ 20us
- Current consumption: Max 25uA
- Industry standard digital interface
- Fully integrated macro
- Standard AMBA APB interface
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PVT Controller (Series 5) (Sub-system for complete PVT monitoring), TSMC N3E
- Monitor multiple instances of Process Monitors, Voltage Monitors & Temperature Sensors
- Temperature & Voltage Alarms / Hard Stops
- PVT Statistics (max min sample values, sample counters)
- Clock synth
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PVT Controller (Series 5) (Sub-system for complete PVT monitoring), TSMC N4P
- Monitor multiple instances of Process Monitors, Voltage Monitors & Temperature Sensors
- Temperature & Voltage Alarms / Hard Stops
- PVT Statistics (max min sample values, sample counters)
- Clock synth
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PVT Controller (Series 5) (Sub-system for complete PVT monitoring), TSMC N5
- Monitor multiple instances of Process Monitors, Voltage Monitors & Temperature Sensors
- Temperature & Voltage Alarms / Hard Stops
- PVT Statistics (max min sample values, sample counters)
- Clock synth
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MIPI I3C Master RISC-V based subsystem
- RISC-V based MIPI I3C master interface has been developed to ease sensor system design architectures in mobile wireless products by providing a fast, low cost, low power, two-wire digital interface for sensors
- All the basic functionalities of MIPI I3C master has been proved with Microsemi smart fusion 2 creative development board .In addition the MIPI I3C master supports for both AHB lite and APB Interface
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In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N3E
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
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In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N4P
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
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In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N3
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
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In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC 28HPC+
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
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In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC 16FFC
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode