In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N3
Overview
A full suite of embedded monitoring IP managed by a PVT controller with standard interfaces, creates a complete subsystem dedicated to maximizing performance, optimizing power, reliability and enabling highly accurate in-chip analytics. This In-Chip Sensing and PVT Monitoring IP is available as part of the Synopsys DesignWare® Foundation IP portfolio. It also forms the foundation of the new Synopsys Silicon Lifecycle Management (SLM) platform. SLM enables new levels of insight for both SoC providers as well as their customers to optimize operational activities at each stage of the device and system lifecycles from design to in-field.
Key Features
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
- Supports dynamic optimisation schemes (DVFS/AVS)
Benefits
- Provides visibility of on chip PVT conditions in real time
- Accurate thermal monitoring and management
- Monitor and optimize the power distribution network under real conditions
- Process speed assessment & characterisation
- Delay loop speed characterisation
- Age Monitoring
- Enhanced reliability
- Accurate monitoring during device and IP characterisation
- Easy production test solution
- Energy and power (DVFS/AVS) optimisation
Applications
- Thermal monitoring and management
- Power and energy optimization
- Process speed assessment
- Enhancing reliability
Deliverables
- Datasheets
- GDSII
- LEF (Abstract) view
- Liberty timing files & LVS netlist
- Verilog model
- RTL & Constraints (PVT-Controller)
Technical Specifications
Foundry, Node
TSMC, N3
Maturity
Available on Request
Availability
Available
TSMC
Pre-Silicon:
3nm
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