Sensor / Monitor IP

The SLM Signal Integrity Monitor (SIM) IP enables signal quality measurement for die-to-die interfaces. It can be implemented in silicon with minimal area overhead. It enables accurate measurement of silicon interconnects with real-time reporting for analytics.
With the use of Monitor, Test and Repair (MTR), this real-time reporting enables structural lane monitoring, aging related degradation, and optional repair of failing lanes to maintain high-speed performance throughout the silicon lifecycle.

The SLM Clock & Delay Monitor (CDM) IP can be implemented in silicon with minimal area overhead. It doesn’t need any accurate high speed reference clock and provides accurate time delay measurement.
It can be used for measuring clock duty cycle, memory access time, delay line characteristics, etc. It has IEEE 1500/1687 interface for connecting to test fabric.
The SLM CDM IP is also available as an ISO 26262 ASIL-B ready product.

The temperature sensor indicates the junction temperature as a 12-bit binary digital code.
It contains a main sensor, remote probes and an ADC. It is capable of monitoring multiple spots via remote probes.
It has a resolution of 0.0625°C /1-code and operates within a junction temperature range of -40°C to 125°C.

The temperature sensor indicates the junction temperature as a 9-bit binary digital code.
It contains a main sensor, remote probes and an Analog-to-Digital Converter (ADC).
It is possible to monitor multiple spots via remote probes.
It has a resolution of 0.5℃/1-code and operates within a junction temperature range of -40℃ to 125℃.

The PVT sensor indicates the junction temperature as a 12-bit binary digital code.
It contains a main sensor, remote probes and an Analog-to-Digital Converter (ADC).
It is possible to monitor multiple spots via remote probes.
It has a resolution of 0.0625℃/1-code and operates within a junction temperature range of -40~125℃.

The TS_SN_TEMP_X8 is a temperature sensor generating an output voltage on VOUT, linearly increasing with junction temperature and trimmable to 2V at 60°C.
It operates with a single supply voltage, VDDA4 (4V typical from the additional IP TS_VR_4V00_X8) and is meant for on-chip internal operation. Its inputs or outputs that need access to bond pads will require the insertion of ESD protected buffers.

The PVT Sensor is a highly integrated macro for monitoring process, voltage, and temperature variation on-chip, allowing very high precision even in untrimmed usage.
It consumes very little power even in operational mode, and leakage power only when measurement is complete.

The Aeonic Insight™ PDN IQ is an in-situ, on-die PDN (Power Delivery Network) analyzer providing transistorlevel PDN telemetry at nanosecond scale.
The telemetry provided can be applied across the silicon lifecycle to optimize power, performance, and reliability.
PDN IQ can be used to characterize V-F curves to develop an optimal setpoint to balance power and performance.

The PVT Sensor is a highly integrated macro for monitoring process, voltage, and temperature variation on-chip, allowing very high precision even in untrimmed usage.
It consumes very little power even in operational mode, and leakage power only when temperature measurement is complete.
An additional voltage sample mode is included allowing for supply voltage monitoring, and process monitor mode to assess transistor performance.