Sensor / Monitor IP

Sensor and Monitor IP cores enable efficient integration of sensor data acquisition and monitoring functions into embedded systems. These IP cores support a wide range of sensors, including temperature, pressure, motion, and environmental sensors, allowing real-time data collection and analysis. With built-in features for signal conditioning, data processing, and communication, Sensor and Monitor IP cores enhance system reliability and accuracy in applications such as IoT, automotive, industrial automation, and healthcare.

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Compare 285 Sensor / Monitor IP from 42 vendors (1 - 10)
  • Ultra-low power high dynamic range image sensor
    • Resolution: VGA (640 x 480)
    • Backside illuminated sensor
    • Pixel size: 6.3 μm x 6.3 μm
    • Fill factor: 83 %
    • Dynamic range: 120 dB intra-scene
    Block Diagram -- Ultra-low power high dynamic range image sensor
  • SLM Signal Integrity Monitor
    • The SLM Signal Integrity Monitor (SIM) IP enables signal quality measurement for die-to-die interfaces. It can be implemented in silicon with minimal area overhead. It enables accurate measurement of silicon interconnects with real-time reporting for analytics.
    • With the use of Monitor, Test and Repair (MTR), this real-time reporting enables structural lane monitoring, aging related degradation, and optional repair of failing lanes to maintain high-speed performance throughout the silicon lifecycle.
    Block Diagram -- SLM Signal Integrity Monitor
  • SLM Clock & Delay Monitor IP
    • The SLM Clock & Delay Monitor (CDM) IP can be implemented in silicon with minimal area overhead. It doesn’t need any accurate high speed reference clock and provides accurate time delay measurement.
    • It can be used for measuring clock duty cycle, memory access time, delay line characteristics, etc. It has IEEE 1500/1687 interface for connecting to test fabric.
    • The SLM CDM IP is also available as an ISO 26262 ASIL-B ready product.
    Block Diagram -- SLM Clock & Delay Monitor IP
  • Temperature Sensor on Samsung 14nm, LN14LPP
    • The temperature sensor indicates the junction temperature as a 12-bit binary digital code.
    • It contains a main sensor, remote probes and an ADC. It is capable of monitoring multiple spots via remote probes.
    • It has a resolution of 0.0625°C /1-code and operates within a junction temperature range of -40°C to 125°C.
    Block Diagram -- Temperature Sensor on Samsung 14nm, LN14LPP
  • Temperature Sensor on Samsung 4nm, LN04LPP
    • The temperature sensor indicates the junction temperature as a 9-bit binary digital code.
    • It contains a main sensor, remote probes and an Analog-to-Digital Converter (ADC).
    • It is possible to monitor multiple spots via remote probes.
    • It has a resolution of 0.5℃/1-code and operates within a junction temperature range of -40℃ to 125℃.
    Block Diagram -- Temperature Sensor on Samsung 4nm, LN04LPP
  • PVT Sensor on Samsung 4nm, LN04LPP
    • The PVT sensor indicates the junction temperature as a 12-bit binary digital code.
    • It contains a main sensor, remote probes and an Analog-to-Digital Converter (ADC).
    • It is possible to monitor multiple spots via remote probes.
    • It has a resolution of 0.0625℃/1-code and operates within a junction temperature range of -40~125℃.
    Block Diagram -- PVT Sensor on Samsung 4nm, LN04LPP
  • Linear Temperature Sensor
    • The TS_SN_TEMP_X8 is a temperature sensor generating an output voltage on VOUT, linearly increasing with junction temperature and trimmable to 2V at 60°C.
    • It operates with a single supply voltage, VDDA4 (4V typical from the additional IP TS_VR_4V00_X8) and is meant for on-chip internal operation. Its inputs or outputs that need access to bond pads will require the insertion of ESD protected buffers.
    Block Diagram -- Linear Temperature Sensor
  • PVT Sensor on INTEL 16
    • The PVT Sensor is a highly integrated macro for monitoring process, voltage, and temperature variation on-chip, allowing very high precision even in untrimmed usage.
    • It consumes very little power even in operational mode, and leakage power only when measurement is complete.
    Block Diagram -- PVT Sensor on INTEL 16
  • On-Die PDN Analyzer for Transistor-Level Visibility and Telemetry
    • The Aeonic Insight™ PDN IQ is an in-situ, on-die PDN (Power Delivery Network) analyzer providing transistorlevel PDN telemetry at nanosecond scale.
    • The telemetry provided can be applied across the silicon lifecycle to optimize power, performance, and reliability.
    • PDN IQ can be used to characterize V-F curves to develop an optimal setpoint to balance power and performance.
    Block Diagram -- On-Die PDN Analyzer for Transistor-Level Visibility and Telemetry
  • Automotive Grade 1 – PVT Sensor on GLOBALFOUNDRIES 22FDX-AG1
    • The PVT Sensor is a highly integrated macro for monitoring process, voltage, and temperature variation on-chip, allowing very high precision even in untrimmed usage.
    • It consumes very little power even in operational mode, and leakage power only when temperature measurement is complete.
    • An additional voltage sample mode is included allowing for supply voltage monitoring, and process monitor mode to assess transistor performance.
    Block Diagram -- Automotive Grade 1 – PVT Sensor on GLOBALFOUNDRIES 22FDX-AG1
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