Bist IP

The BIST can realize all eFlash testing items, covering UMC’s 40nm and 55nm processes, as well as SST’s 0.11um and 0.18um processes, and customized embedded eFlash IP wafer software testing and final testing.
The BIST features a flexible serial interface, reducing the need for IC test pins and increasing testing flexibility.

Uses 8T-TP185SL bit cells.
Isolated Supplies: Periphery and array power domains can be independently powered down in standby mode.
Deep Sleep Standby Mode: Memory retains data at minimal power via internal biasing.

Supports JEDEC HBM4 DRAMs
Supports data rates up to 12 Gbps
Supports up to 32 independent 64-bit memory channels
Pseudo-channel operation supported to enable up to 64 32-bit pseudo-channels with 2048-bit PHY

The icyTRX-LE-22 RF transceiver PHY IP delivers an optimal trade-off between power consumption and Bluetooth Low Energy (LE) RF performance — excellent sensitivity and strong interference rejection — while minimizing the overall cost for loT applications.
Occupying just 0.57 mm2 in a 22 nm technology (7 metal layers), the analog RF portion of the IP integrates on-chip passives and Built-In-Self-Test (BIST) structures to drive down silicon area, wafer cost, bill of materials, and production-test expenses.

The AI and HPC industries are advancing toward chiplet-based designs to achieve superior performance, as traditional monolithic SoCs face scaling challenges
Heterogeneous integration is driving semiconductor innovation but adds complexity to chip design, requiring advanced testing methodologies and improved Automated Test Equipment (ATE)
Increasing test patterns and limited package pins demand high-bandwidth IOs, while advancements in ATE capabilities further necessitate optimized GPIOs to support higher-speed, efficient and low-cost testing
Synopsys High-Speed Test IO IP is a cutting-edge IO interface solution that enables efficient, high-speed testing of complex semiconductor designs while minimizing hardware complexity and cost