A memory BIST solution which has been optimized for Dolphin memories

Overview

Dolphin Technology now provides a memory BIST solution which has been optimized for Dolphin memories. It supports all Dolphin memory compilers, including SRAM and RF.
- Fully automated MBIST RTL and Gate flow
- Fully supported BIST test, diagnosis and soft/hard repair
- Fully supported eFuse controller for automated hard repair
- Fully supported ICL/PDL of IEEE 1687

Key Features

  • + Analyze RTL design or netlist to identify memories
  • + Plan MBIST engines
  • + Insert into RTL design or netlist / Top level hookup to JTAG
  • + Verify stand-alone/ Verify partition level / Verify top level
  • + Automated subchip integration flow
  • + Fully supported P1500 interface and Tap controller
  • + Generate test patterns and SVF file
  • + Incremental repair capability / Programmable March-style algorithm
  • + APB interface for BIST test and fuse operation
  • + Diagnosis test, Characterization test and SVF debug flow

Applications

  • Communications, Data Processing, Industrial, Automotive

Deliverables

  • Encrypted Verilog/SystemVerilog RTL, or post-synthesis netlist
  • Synthesis and STA scripts
  • User guide documents
  • SV/UVM Verification suite with BFM

Technical Specifications

Maturity
Available
Availability
Yes
×
Semiconductor IP