monitoring IP
Filter
Compare
478
IP
from 82 vendors
(1
-
10)
-
Tessent in-life monitoring
- Bus Monitor enables complete, transaction-level visibility of SoC bus activity across all major standards (AXI, ACE, OCP)
- Network-on-Chip (NOC) Monitor provides transaction-level visibility for devices using the Arm AMBA 5 Coherent Bus Interface (CHI)
- Status Monitors provides embedded logic analyzer capability
- Processor Analytics provides run-control, performance monitoring, cross triggering, and event driven control of embedded processors.
-
In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N7
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
-
Process Detector (For DVFS and monitoring process variation), TSMC N7
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
-
Process Detector (For DVFS and monitoring process variation), TSMC 12FFC
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
-
In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N3E
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
-
PVT Controller (Series 5) (Sub-system for complete PVT monitoring), TSMC N3E
- Monitor multiple instances of Process Monitors, Voltage Monitors & Temperature Sensors
- Temperature & Voltage Alarms / Hard Stops
- PVT Statistics (max min sample values, sample counters)
- Clock synth
-
Voltage Monitor with Digital Output (Multi-domain supply monitoring), TSMC N3E
- Accurately measures core supply domain and IO voltages
- Measurement of supply ranges up to 1.5V (with Prescaler)
- Measurement of IR drops between supply pins and critical blocks
- Digital interface for simplified chip integration
-
Process Detector (For DVFS and monitoring process variation), TSMC N3E
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
-
In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N4P
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
-
PVT Controller (Series 5) (Sub-system for complete PVT monitoring), TSMC N4P
- Monitor multiple instances of Process Monitors, Voltage Monitors & Temperature Sensors
- Temperature & Voltage Alarms / Hard Stops
- PVT Statistics (max min sample values, sample counters)
- Clock synth