Secure Embedded Flash IP
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19
IP
from 6 vendors
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10)
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Embedded Flash Protection with Hardware Root of Trust and Lite Crypto Engine
- PUFef is designed to protect embedded flash with the hardware root of trust and a lite crypto engine of RC6.
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55nmHV MTP Non Volatile Memory for Standard CMOS Logic Process
- 1K-Time Programmable (MTP)
- > 10 years retention
- Uses standard CMOS process with no additional masks
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MTP Non Volatile Memory for TSMC 180nm BCD Process
- High-Reliability for Automotive Applications
- 10K-Time Programmable (MTP)
- > 10 years retention
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FTP Non Volatile Memory for Standard TSMC 40nm ULP Process
- Ultra Low Power Read (30uA/MHz for 39b-IO) at 0.85V Single Power
- 10-Time Programmable
- > 10 years retention
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180nm MTP Non Volatile Memory for Standard CMOS Logic Process
- 10K-Time Programmable (MTP)
- > 10 years retention
- Uses standard CMOS process with no additional masks
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130nm FTP Non Volatile Memory for Standard CMOS Logic Process
- One-Time Programmable (OTP)
- > 10 years retention
- Uses standard CMOS process with no additional masks
- 100% testable prior to programming
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130nm OTP Non Volatile Memory for Standard CMOS Logic Process
- One-Time Programmable (OTP)
- > 10 years retention
- Uses standard CMOS process with no additional masks
- 100% testable prior to programming
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90nm FTP Non Volatile Memory for Standard CMOS Logic Process
- Few (4x) Times Programmable (FTP) - Previous programmed data always available
- > 10 years retention
- Uses standard CMOS process with no additional masks
- 100% testable prior to programming
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90nm OTP Non Volatile Memory for Standard CMOS Logic Process
- One-Time Programmable (OTP)
- > 10 years retention
- Uses standard CMOS process with no additional masks
- 100% testable prior to programming
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180nm FTP Non Volatile Memory for Standard CMOS Logic Process
- Few (3) Times Programmable (FTP) - Previous programmed data always available> 10 years retention
- Uses standard CMOS process with no additional masks
- 100% testable prior to programming
- Includes comprehensive Built-in Self Test