Sensor / Monitor IP for TSMC

Compare 16 Sensor / Monitor IP for TSMC from 6 vendors (1 - 10)

Filter:

Ultra‐Low‐Power Process/Voltage/Temperature Monitor on TSMC 7nm FFC
- The ODT-PVT-ULP-001C-7T is an ultra-low power temperature, voltage and process monitor designed in a 7nm CMOS process.
- This IP operates over the entire temperature range of -40°C to 150°C.
- The temperature monitor achieves ±4C temperature accuracy without trim and ±1C temperature accuracy after a single room temperature trim.
Ultra-Low-Power Process/Voltage/Temperature Monitor on 7nm
- The ODT-PVT-INT-001C-7 is an ultra-low power Temperature, Voltage and Process Monitor designed in a 7nm CMOS process.
- This IP operates over the entire temperature range of -40°C to 125°C.
- The Temperature Monitor (TM) achieves ±4°C temperature accuracy without trim and ±1°C temperature accuracy after a single room temperature trim.
PVT Sensor Subsystem
- Start-up time: Typ 20us
- Current consumption: Max 25uA
- Industry standard digital interface
- Fully integrated macro
- Standard AMBA APB interface
Temperature Sensor (Digital Output)
- Measurement Range: -20°C to +100°C
- Uncalibrated Accuracy: ±6°C
PVT Sensor on TSMC CLN7FF
Power Supply Glitch Detector on TSMC CLN7FF
- Integrated voltage reference for precision stand-alone operation
- Easy to integrate with no additional components or special power requirements
- Easy to use and configure
- Cascadable for any number of glitch detection channels
Integrated Bandgap and Current Reference on TSMC CLN7FF
- Easy to integrate with no additional components or special power requirements
- Easy to use and configure
- Low power consumption
- Implemented with Analog Bits’ proprietary architecture
Process Detector (For DVFS and monitoring process variation), TSMC 12FFC
- Measurement of multiple device types
- Support for custom delay chain structures
- Signature Response on Demand
- Scan-path Inserted
Thermal Diode (TD) with Base Pin, TSMC N7
- Easily integrated
- Sense die temperature using external current source
- Created using standard digital process layers.
- Small size
In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N7
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode