Process/Voltage/Temperature Sensor (Supply voltage 3.3V/0.9V)

Overview

028TSMC_PVT_04 is a unique solution intended to continuously monitor IC status at several on-die locations. It is able to detect manufacturing process deviation, perform voltage and die temperature measurement. PVT Detector consists of VT module as a calculation center for voltage and temperature measurements, Process detector with process unit for standard-voltage, low-voltage and high-voltage threshold MOS transistors and IO 2.5V transistor, voltage/temperature sensor units and voltage sensor units. VT module is able to maintain up to 32 external voltage and voltage/temperature sensor units of four types in any variations: for Core voltage measurement range from 0.1V to 1.15V, for IO voltage measurement range from 1.5V÷2.0V, for IO voltage measurement range from 1.5V÷3.63V and additional 4.0V÷7.0V IO voltage measurement range. Process detector embeds VT sensor unit for Core voltage measurement and can be placed on the die in quantity up to 31 cells.

Key Features

TSMC 28nm eFlash
Temperature measurement range -40°C ÷ +150°C
Core and IO Voltage measurement range: 0.1V to 1.15V, 1.5V to 2.0V, 1.5V to 3.63V and 4V to 7V
High accuracy temperature and voltage measurements
Remote process detectors for different types of transistors: standard-voltage and high voltage threshold MOS transistors
Up to 32 remote voltage and temperature/voltage sensors
Process detector dedicated digital test output
Glitch detector mode
Flexible input clock: 32.768kHz to 12MHz
IO supply voltage 2.97V÷3.63V
Core supply voltage 0.81V÷0.99V
Automotive compliant: junction temperature grade 1: -40?C to +150?C

Applications

Die temperature monitoring
Core and IO voltage low battery indication
Process deviation detection
Pseudo static analog digitization
System performance detection

Deliverables

Schematic or NetList
Abstract view (.lef and .lib files)
Layout (optional)
Behavioral model (for functional verification)
Extracted view (optional)
GDSII
DRC, LVS, antenna report
Test bench with saved configurations (optional)
Documentation

Technical Specifications

Foundry, Node

TSMC 28nm eFlash

Maturity

silicon proven

Availability

Now

TSMC

Silicon Proven: 28nm

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