High-Speed Test IO

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Compare 2 High-Speed Test IO from 1 vendors (1 - 2)

SLM High-Speed Access & Test IP
- The SLM High-Speed Access and Test (HSAT) IP combined with the TestMAX® ALE software uses standard high speed IO interfaces such as PCIe and USB, to get test, debug and monitoring data in and out of an SoC at Gigabit data rates and avoids the need for large numbers of test and interface pins.
- Test time can be reduced because the link between the test time and GPIO data rate is eliminated. Further, this solution provides a key component for Synopsys Silicon Lifecycle Management solution allowing manufacturing tests to be repeated in-system and in-field as well as providing high speed access to PVT and functional monitor dat
TSMC N3P 1.2V High-Speed Test IO
- The AI and HPC industries are advancing toward chiplet-based designs to achieve superior performance, as traditional monolithic SoCs face scaling challenges
- Heterogeneous integration is driving semiconductor innovation but adds complexity to chip design, requiring advanced testing methodologies and improved Automated Test Equipment (ATE)
- Increasing test patterns and limited package pins demand high-bandwidth IOs, while advancements in ATE capabilities further necessitate optimized GPIOs to support higher-speed, efficient and low-cost testing
- Synopsys High-Speed Test IO IP is a cutting-edge IO interface solution that enables efficient, high-speed testing of complex semiconductor designs while minimizing hardware complexity and cost