USB 3.0/ PCIe 3.0/ SATA 3.0 Combo PHY IP, Silicon Proven in SAM 8LPP

Overview

The unified PHY complies with the USB, USB 3.0, Serial ATA, Peripheral Component Interconnect Express (PCIe), and USB 2.0 interface protocols (USB High-speed and Full speed). Supporting additional internal power gating, reference clock control, and PLL control allows for reduced power use. The PHY is particularly useful for a variety of situations under various considerations of power consumption because of the flexibility of the aforementioned low power mode option.

Key Features

  • Compatible with PCIe/USB3/SATA base Specification
  • Fully compatible with PIPE3.1 interface specification
  • Data rate configurable to 1.5G/2.5G/3G/5G/6G for different application
  • Support 16-bit or 32-bit parallel interface when encode/decode enabled
  • Support 20-bit parallel interface when encode/decode bypassed
  • Support flexible reference clock frequency
  • Support 100MHz differential reference clock input or output (optional with SSC) in PCIe Mode
  • Support Spread-Spectrum clock (SSC) generation and receiving from 5000ppm to 0ppm
  • Support programmable transmit amplitude and De-emphasis
  • Support TX detect RX function in PCIe and USB3.0 Mode
  • Support Beacon signal generation and detection in PCIe Mode
  • Support Low Frequency Periodic Signaling (LFPS) generation and detection in USB3.0 Mode
  • Support COMWAKE, COMINIT and COMRESET (OOB) generation and detection in SATA Mode
  • Support L1 sub-state power management
  • Support RX low latency mode in SATA operation mode
  • Support Loopback BERT and Multiple Pattern BIST Mode
  • HPC Plus 0.9V/1.8V 1P8M
  • ESD:HBM/MM/CDM/LatchUp2000V/200V/500V/100mA
  • Silicon Proven in SAM 8LPP

Applications

  • PC
  • Television
  • Data Storage
  • Multimedia Devices
  • Recorders
  • Mobile Devices

Deliverables

  • Application Note / User Manual
  • Behavior model, and protected RTL codes
  • Protected Post layout netlist and Standard
  • Delay Format (SDF)
  • Synopsys library (LIB)
  • Frame view (LEF)
  • Metal GDS (GDSII)
  • Test patterns and Test Documentation

Technical Specifications

Maturity
In Production
Availability
Immediate
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Semiconductor IP