USB 3.0/ PCIe 2.0/ SATA 3.0 Combo PHY IP, Silicon Proven in SMIC 12SF++

Overview

Serial ATA (SATA) compliant with SATA 3.0 Specification, Peripheral Component Interconnect Express (PCIe) compliant with PIPE interface protocol, and USB compliant with USB 3.0, USB 2.0, make up the combo PHY (USB High-speed and Full speed). Lower power consumption is achieved by supporting additional internal power gating, reference clock control, and PLL control. Due to the flexible nature of the aforementioned low power mode option, the PHY is also extremely beneficial for a variety of situations under different considerations of power consumption.

Key Features

  • Compatible with PCIe/USB3/SATA base Specification
  • Fully compatible with PIPE3.1 interface specification
  • Data rate configurable to 1.5G/2.5G/3G/5G/6G for different application
  • Support 16-bit or 32-bit parallel interface when encode/decode enabled
  • Support 20-bit parallel interface when encode/decode bypassed
  • Support flexible reference clock frequency
  • Support 100MHz differential reference clock input or output (optional with SSC) in PCIe Mode
  • Support Spread-Spectrum clock (SSC) generation and receiving from 5000ppm to 0ppm
  • Support programmable transmit amplitude and De-emphasis
  • Support TX detect RX function in PCIe and USB3.0 Mode
  • Support Beacon signal generation and detection in PCIe Mode
  • Support Low Frequency Periodic Signaling (LFPS) generation and detection in USB3.0 Mode
  • Support COMWAKE, COMINIT and COMRESET (OOB) generation and detection in SATA Mode
  • Support L1 sub-state power management
  • Support RX low latency mode in SATA operation mode
  • Support Loopback BERT and Multiple Pattern BIST Mode
  • HPC Plus 0.9V/1.8V 1P8M
  • ESD:HBM/MM/CDM/LatchUp2000V/200V/500V/100mA
  • Silicon Proven in SMIC 12SF++

Deliverables

  • Application Note / User Manual
  • Behavior model, and protected RTL codes
  • Protected Post layout netlist and Standard
  • Delay Format (SDF)
  • Synopsys library (LIB)
  • Frame view (LEF)
  • Metal GDS (GDSII)
  • Test patterns and Test Documentation

Technical Specifications

Maturity
In Production
Availability
Immediate
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Semiconductor IP