PVT Detector is a unique solution intended to continuously monitor IC status at several on-die locations. It is able to detect manufacturing process deviation, perform voltage and die temperature measurement.
PVT Detector consists of VT module as a calculation center for voltage and temperature measurements, Process detector with process unit for Low VT and Super low VT at different channel length (20, 24, 28, 32, 36 nm) and 1.8V IO transistor, and voltage/temperature sensor units.
VT module is able to maintain up to 16 external voltage/ temperature sensor units of three types in any variations: for Core voltage measurement range from 0.58V to 0.92V and for IO voltage measurement range from 1.5V÷2.0V and additional 3.3V IO voltage measurement range 1.5V÷3.63V.
Process detector embeds VT sensor unit for Core voltage measurement and can be placed on the die in quantity up to 16 cells. Optionally, Process detector is able to maintain a process variation for 1.8V IO transistor and in this case 1.5V÷2.0V VT sensor unit should be connected to the process detector remotely.
Glitch detector mode allows to monitor and detect rapid fluctuations of voltage and temperature.
PVT Detector
Overview
Key Features
- GF 22nm FDX
- Temperature measurement range -55°C ÷ +150°C
- Core and IO Voltage measurement range: 0.1V÷0.92V, 1.5V÷2.0V and 1.5V÷3.63V
- High accuracy temperature and voltage measurements
- Remote process detectors for Low VT and Super low VT of different channel length (20, 24, 28, 32, 36 nm) and 1.8V IO transistor
- Up to 16 remote temperature/voltage sensors
- Process detector dedicated digital test output
- Glitch detector mode
- Flexible input clock: 50kHz to 12MHz
- Low leakage
- IO supply voltage 1.62V÷1.98V
- Core supply voltage 0.72V÷0.88V
Applications
- Die temperature monitoring
- Core and IO voltage low battery indication
- Process deviation detection
- Pseudo static analog digitization
- System performance detection
Deliverables
- Schematic or NetList
- Abstract model (.lef and .lib files)
- Layout view (optional)
- Behavioral model (Verilog)
- Extracted view (optional)
- GDSII
- DRC, LVS, antenna report
- Test bench with saved configurations (optional)
- Documentation
Technical Specifications
Foundry, Node
Globalfoundries 22nm FDX
Maturity
silicon proven
Availability
Now
GLOBALFOUNDRIES
Pre-Silicon:
22nm
FDX
Silicon Proven: 22nm FDX
Silicon Proven: 22nm FDX