JESD204B Tx-Rx PHY IP, Silicon Proven in SMIC 14SF++
Overview
In addition providing complete support for the JESD204B synchronous serial interface, the JESD204B Tx-Rx PHY IP interface is consistent with the JESD204B version specification. Because of its interoperability, it provides a simple interface for a variety of inexpensive devices. The JESD204B PHY features complete and comprehensive transceiver capabilities in addition to individual Tx and Rx.
Key Features
- Multiple lanes transceiver with data rate from 1Gbps to 16Gbps: Transceiver version including both receiver and transmitter
- Transmitter only version available
- 40bit/32bit/20bit/16bit selectable parallel data bus Independent per-lane power down control
- Programmable transmit amplitude
- Programmable 3-tap feed forward equalizer (FFE)
- Embedded receiver equalization (CTLE and DFE) to compensate insertion loss
- Build in self-test with multiple pattern generation and checker for production test
- Flexible reference clock frequency range
- Integrated LC-tank PLL and Ring OSC PLL
- Integrated on-chip differential 100-ohm termination for reference clock
- Low capacitance ESD structures
- Integrated on-chip differential 100 ohm termination in TX and RX: Termination resistance auto calibration function (optional)
- Support both Flip Chip Package and Wire Bonding Package
- Testability: High Testability
- Built-in pattern generator and checker including PRBS Internal serial loopback
- Reliability: Lifetime: 10 years
- Lifetime Average Temperature: up to 110 degC (include hot-spot)
- Availability: 100%
- ESD (HBM): over 2000V
- ESD (CDM): over 250V
- Latch-up: Satisfy JESD78 ClassII (Tj=125c), >100mA
- Silicon Proven in SMIC 12nm SF++
Applications
- Low Power Consumption
- Low Physical Area compared to market standard
- Operating Temperature: ~ 110degrees
- Layered and Structured architecture
Deliverables
- Application Note / User Manual
- Behavior model, and protected RTL codes
- Protected Post layout netlist and Standard
- Delay Format (SDF)
- Frame view (LEF)
- Metal GDS (GDSII)
- Test patterns and Test Documentation
Technical Specifications
Maturity
In Production
Availability
Immediate
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