HBM3/2E Combo PHY&Controller

Overview

The third-generation HBM (HBM3/2E) technology, outlined by the JESD235C standard, inherits physical 128-bit DDR interface with 2n/4n prefetch architecture, internal organization, 1024-bit input/output, 1.2 V I/O and core voltages as well as all the crucial parts in the original technology. Just like the predecessor, HBM3/2E supports two, four, eight or twelve DRAM devices on a base logic die (2Hi, 4Hi, 8Hi, 12Hi stacks) per KGSD. HBM Gen 3 expands the capacity of DRAM devices within a stack to 24GB and increases the data rate by up to 7.2Gb/s per pin. In addition, the new technology brings an important improvement to bandwidth maximization.

The INNO HBM3/2E is part of Innosilicon’s broad leading-edge memory IP portfolio that includes GDDR6/6X and DDR5/LPDDR5. Developed by the experienced team with great expertise, the Innosilicon product family enables customers to achieve the best design results while accelerating time to market.

Key Features

  • Compliant with JEDEC Specification, up to 6400Mbps for HBM3 mode, 3600Mbps for HBM2E mode
  • Compliant with DFI 3.1 Specifications (dfi_clk_1x: WDQS = 1:4 for HBM3 Mode, dfi_clk_1x: WDQS = 1:2 for HBM2E Mode)
  • For HBM3 mode, support up to 16 channels with 64 DQ-width + Optional DBI/ECC/SEV pin support/channel
  • For HBM2E mode, support up to 8 channels with 128 DQ-width
  • Supports command and DQ parity
  • Supports per-AWORD de-skew tuning for command
  • Supports bit-group de-skew tuning for data
  • Supports CMD lane repair
  • Supports DQ lane repair
  • Supports automatic and soft command bus training
  • Supports command and data IO driver strength adjustment
  • Supports automatic and soft RX DQS training and bypass RX DQS control
  • Supports automatic and soft WDQS2CK training (only for HBM3 mode) and bypass WDQS2CK Control
  • Supports automatic and soft read training
  • Supports automatic and soft write training
  • Supports bypass write and read trainings
  • Supports ZQ calibration
  • Supports Built-In Self-Test
  • Supports boundary scan of pad
  • Supports scan chain
  • APB 3.0 interfaces to configure registers
  • Supports IEEE1500 port for direct access to the memory stack and PHY using APB
  • Supports HBM DRAM initialized by PHY

Benefits

  • Substantially increases bandwidth available to computing devices
  • Fully pre-assemble design, drop-in hard macro to ease integration and speed time to market
  • Offers leading performance, power, and area per terabit
  • Extensive EDA tool support for various design automation flows
  • DFT functions to reduce test time and ensure high test coverage
  • Proven capabilities in PHY and silicon interposer design and integration
  • Optional PI/SI and thermal co-design service
  • Full support from IP delivery to production

Applications

  • High performance computing
  • Artificial intelligence
  • GPU

Deliverables

  • Verilog models
  • LEF
  • Place-and-route abstracts
  • GDSII files
  • LVS netlists
  • Optional extracted HSPICE netlist for I/Os
  • Databook, Application notes
  • Silicon validation and ESD testing results
  • Optional PCB reference design and Package Electrical Model
  • Documentation

Technical Specifications

Foundry, Node
Samsung 5nm
Maturity
Silicon Proven
TSMC
In Production: 5nm
Pre-Silicon: 5nm
Silicon Proven: 5nm
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Semiconductor IP