PVT Monitor IP
Welcome to the ultimate PVT Monitor IP hub! Explore our vast directory of PVT Monitor IP.
Process, voltage, and temperature (PVT) monitors are semiconductor IP circuits that are typically embedded inside of system-on-chip (SoC) designs. Sensing the dynamic operating environment of the SoC (i.e., the voltage and temperature) as well as the static condition (i.e., process) provides a method to optimize the SoC’s performance based on the local conditions the chip is experiencing. Performance and power consumption can be optimized with this information. It is also possible to detect anomalies in chip performance that might stem from an SoC/system failure or a security breach.
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PVT Monitor IP
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53
PVT Monitor IP
from 9 vendors
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10)
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PVT Sensor Subsystem
- Start-up time: Typ 20us
- Current consumption: Max 25uA
- Industry standard digital interface
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PVT Sensor TSMC 40G
- High precision, trimmed and untrimmed
- Low operational power, low leakage
- Simple digital interface
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In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N7
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
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PVT - Process, Voltage, and Temperature Monitor - TSMC 16nm
- TSMC 16nm FFC
- ± 4C temperature accuracy without trim
- ± 1C temperature accuracy after single room temperature trim
- 0.011C temperature resolution
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In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N3E
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
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PVT Controller (Series 5) (Sub-system for complete PVT monitoring), TSMC N3E
- Monitor multiple instances of Process Monitors, Voltage Monitors & Temperature Sensors
- Temperature & Voltage Alarms / Hard Stops
- PVT Statistics (max min sample values, sample counters)
- Clock synth
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In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N4P
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
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PVT Controller (Series 5) (Sub-system for complete PVT monitoring), TSMC N4P
- Monitor multiple instances of Process Monitors, Voltage Monitors & Temperature Sensors
- Temperature & Voltage Alarms / Hard Stops
- PVT Statistics (max min sample values, sample counters)
- Clock synth
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In-Chip Monitoring Subsystem for Process, Voltage & Temperature (PVT) Monitoring, TSMC N6
- PVT Subsystem supporting a configurable monitoring fabric
- Measurement of dynamic and static conditions in-chip
- Thermal profiling of silicon devices
- Supply voltage analysis during device ‘mission’ mode
-
PVT Controller (Series 5), TSMC N6
- Monitor multiple instances of Process Monitors, Voltage Monitors & Temperature Sensors
- Temperature & Voltage Alarms / Hard Stops
- PVT Statistics (max min sample values, sample counters)
- Clock synth