Agentic AI-based Coverage Closure for Formal Verification
By Sivaram Pothireddypalli 1, Ashish Raman 2, Deepak Narayan Gadde 3, Aman Kumar 1
1 Infineon Technologies India Private Limited, India
2 Dr. B R Ambedkar National Institute of Technology Jalandhar, India
3 Infineon Technologies Dresden AG & Co. KG, Germany

Abstract
Coverage closure is a critical requirement in Integrated Chip (IC) development process and key metric for verification sign-off. However, traditional exhaustive approaches often fail to achieve full coverage within project timelines. This study presents an agentic AI-driven workflow that utilizes Large Language Model (LLM)-enabled Generative AI (GenAI) to automate coverage analysis for formal verification, identify coverage gaps, and generate the required formal properties. The framework accelerates verification efficiency by systematically addressing coverage holes. Benchmarking open-source and internal designs reveals a measurable increase in coverage metrics, with improvements correlated to the complexity of the design. Comparative analysis validates the effectiveness of this approach. These results highlight the potential of agentic AI-based techniques to improve formal verification productivity and support comprehensive coverage closure.
Index Terms — Agentic AI, LLM, Hardware Design, Formal Verification, Coverage
To read the full article, click here
Related Semiconductor IP
- TSMC 7nm 0V75 / 0V9 ESD Local Clamp – Low Cap
- TSMC 65nm 3V3 ESD Local Clamp – Rad Hard
- TSMC 5nm 1V8, 1.2V and 0.9V ESD Local Protection – Low Cap
- TSMC 3nm 3V3 ESD Local Clamp
- TSMC 3nm 1V2 ESD Local Clamp – Low Capacitance
Related Articles
- How formal verification saves time in digital IP design
- Don't over-constrain in formal property verification (FPV) flows
- Formal Verification Has It Covered!
- Formal property verification: A tale of two methods
Latest Articles
- LACE: Large Language Model Aided Multi-Agent Framework for Agile RISC-V Instruction Extension
- A Process-Aware Hybrid Si/IGO Monolithic-3D 6T SRAM with BEOL Pass-Gates for the 2nm Node
- Automated Estimation of MBIST Area and Test Time in Heterogeneous Memory IPs via Stacked Ensemble Framework
- VIPER: Architecture-Aware Performance Modeling for Processing-in-Memory Design-Space Exploration
- CTTE: An Open Dual-Protocol RISC-V Trace Encoder for N-Trace and E-Trace