How formal verification saves time in digital IP design
David Vincenzoni
EDN (November 10, 2015)
It is well known that the task of verification looms large in the design of digital IP, as well as the design of SoCs. The target is to reach 100% for both RTL code and functional coverage, minimizing the time spent obtaining it. The most widely used methodology is based on Universal Verification Methodology (UVM) random constrained tests (either System Verilog or e language) that permit the construction of complex tests in a relatively short time while stressing the RTL code and keeping track of functional coverage. Some verification engineers also use formal methodology for verifying a dedicated part of the block such as standard interfaces, which completes the verification of the IP.
This article will describe a different approach for digital IP verification based on formal methodology, exhaustively verifying the functionalities through the definition of properties. The formal approach has the advantage of avoiding development of test benches. This new flow has been used during the design of a digital IP and has proven to significantly shrink verification time.
To read the full article, click here
Related Semiconductor IP
- NPU IP
- JPEG XL Encoder
- I2C Master/Slave Controller Core
- NVMe Validation Test Suite
- Hybrid Memory Cube Verification IP
Related Articles
- Formal-based methodology cuts digital design IP verification time
- Time Interleaving of Analog to Digital Converters: Calibration Techniques, Limitations & what to look in Time Interleaved ADC IP prior to licensing
- It's Not My Fault! How to Run a Better Fault Campaign Using Formal
- IC design: A short primer on the formal methods-based verification
Latest Articles
- Terracotta: Enabling the Adoption of New DRAM Techniques via a Flexible DRAM Interface and Memory Controller
- A Framework for Accelerating Transformer Inference on RISC-V for Edge AI
- An Interleaved Parallel Dependent Quantization Hardware Architecture for H.266/VVC
- A Formal Security Analysis of CAN XL
- A Secure dToF LiDAR SoC with Dual-Domain Fingerprinting and Event-Driven AFE Circuit Achieving Sensor-Level Attack Resilience