System-in-package provides viable integration solution
Matt Romig and Vikas Gupta, Texas Instruments
EETimes (2/22/2012 12:59 PM EST)
The increasing opportunities and requirements for system-in-package (SiP) technologies have become a driving force in the electronics and semiconductor industry. A number of companies are focused on maximizing the benefits and meeting the challenges that SiP brings.
Some SiP technologies, such as wirebonded multichip modules and advanced MCMs, have been around for decades; others, such as package-on-package stacking, are more recent. Such newer technologies as 2.5-D interposers and 3-D through-silicon via (TSV) can bring new challenges along with new capabilities.
Depending on the design and application space, SiPs can:
- improve performance with tighter integration and co-design;
- increase power efficiency, with shorter data transmission channels;
- enable heterogeneous integration via different technologies;
- lower total cost by reducing the system size and bill of materials (BOM);
- reduce complex system-on-chip (SoC) development for shorter time-to-market; and
- miniaturize devices by stacking components, vs. side-by-side layout.
But SiP products also have unique challenges.
To read the full article, click here
Related Semiconductor IP
- TSMC 7nm 0V75 / 0V9 ESD Local Clamp – Low Cap
- TSMC 65nm 3V3 ESD Local Clamp – Rad Hard
- TSMC 5nm 1V8, 1.2V and 0.9V ESD Local Protection – Low Cap
- TSMC 3nm 3V3 ESD Local Clamp
- TSMC 3nm 1V2 ESD Local Clamp – Low Capacitance
Related Articles
- Facilitating System-in-Package (SiP) design
- Retargeting IP -> System-in-package option aids reuse
- RF system-in-package competes with SoCs
- Test may decide choice of SoC or system-in-package
Latest Articles
- LACE: Large Language Model Aided Multi-Agent Framework for Agile RISC-V Instruction Extension
- A Process-Aware Hybrid Si/IGO Monolithic-3D 6T SRAM with BEOL Pass-Gates for the 2nm Node
- Automated Estimation of MBIST Area and Test Time in Heterogeneous Memory IPs via Stacked Ensemble Framework
- VIPER: Architecture-Aware Performance Modeling for Processing-in-Memory Design-Space Exploration
- CTTE: An Open Dual-Protocol RISC-V Trace Encoder for N-Trace and E-Trace