Revolutionizing Electronic Circuit Testing and Debugging Using JTAG
The Joint Test Action Group (JTAG) was formed in mid 1980s to develop a method of verifying designs and testing printed circuit boards after manufacture. Prior to the development of JTAG, testing and debugging of electronic circuits was a time-consuming and costly process. Engineers had to manually probe and test each individual pin on a circuit board, which was not only slow but also prone to errors.
JTAG was created to provide a standardized interface for testing and debugging electronic circuits. It uses a special set of test access ports (TAPs) that allow engineers to interact with the circuit and perform a wide range of tests and debugging tasks.
The first version of the JTAG standard was released in 1990, and it quickly gained popularity among engineers and manufacturers. In the years since, the JTAG standard has been revised and updated several times, with new features and capabilities added to make testing and debugging even easier and more efficient.
To read the full article, click here
Related Semiconductor IP
- Ultra Ethernet MAC & PCS 100G/200G/400G/800G
- Ethernet PCS 100G/200G/400G/800G/1.6T
- Ethernet MAC 100G/200G/400G/800G/1.6T
- Junction Over-Temperature Detector with Linear Centigrade-to-Voltage Output - X-FAB XT018
- Performance P570 Gen 3
Related Blogs
- Revolutionizing Power Efficiency in PCIe 6.x: L0p and Flit Mode in Action
- High-Speed Test IO: Addressing High-Performance Data Transmission And Testing Needs For HPC & AI
- Verification of UALink (UAL) and Ultra Ethernet (UEC) Protocols for Scalable HPC/AI Networks using Synopsys VIP
- Tips on Using e Macros to Raise Abstraction and Facilitate Reuse
Latest Blogs
- Inside the SiFive Performance™ P570 Gen 3: High Performance Efficiency for Next-Generation Consumer and Commercial Applications
- What the steam engine can teach us about modern chip design
- Automotive silicon in the era of AI, functional safety, and cybersecurity
- JPEG XS Officially Joins GenICam, The Machine Vision Standard Managed By EMVA
- Beyond PCIe Compliance: Why Stress Testing Is Crucial for Edge AI Deployments