JTAG (IEEE 1149.1/1149.6) Assertion IP
JTAG (IEEE 1149.1/1149.6) Assertion IP provides an efficient and smart way to verify the JTAG designs quickly without a testbench.
- Test / Debug
SerDes Test / Debug IP cores provide physical-layer signaling for high-speed serial interfaces in modern SoC and ASIC designs.
These IP cores support validation, measurement, and compliance-oriented access to high-speed serial links during bring-up and production, giving designers reusable building blocks for reliable signaling across advanced serial protocols and custom links
This catalog allows you to compare SerDes Test / Debug IP cores from leading vendors based on signal integrity, data rate, power efficiency, and process node compatibility.
Whether you are designing validation environments, production test, high-speed interface platforms, or lab and debug workflows, you can find the right SerDes Test / Debug IP for your application.
JTAG (IEEE 1149.1/1149.6) Assertion IP
JTAG (IEEE 1149.1/1149.6) Assertion IP provides an efficient and smart way to verify the JTAG designs quickly without a testbench.
32Gbps, 31 order, Pseudo Random Bit Sequence Generator / Checker
This unit generates and checks Pseudo Random Bit Sequence (PRBS) of 31 order, up to 32Gbps.
The DTS Adapter from Silvaco enables an existing IEEE 1149.1 debug test system (DTS) to take advantage of the debug/test capabili…
cjTAG IEEE 1149.7 Compact TAP Controller
The Compact TAP IP from Silvaco provides an IEEE 1149.7-compliant Test Access Port (TAP), enabling you to take advantage of IEEE …
The OT4001_cjtag is an adapter which permits legacy IEEE 1149.1 ports to communicate as an IEEE 1149.7 2-wire OScan1 cJTAG port.
32Gbps Pseudo Random Bit Sequence Generator/Checker
This unit generates and checks Pseudo Random Bit Sequence (PRBS) of 7 or 15 order, up to 32Gbps.
The JTAG Verification IP provides an effective & efficient way to verify the components interfacing with the JTAG interface of an…
Dolphin Technology provides JTAG Controller (TAP) IP which enables access through the JTAG interface for building designs with ef…
ChipScope Pro (IBERT) for Virtex-6 FPGA GTH
The LogiCORE™ ChipScope™ Pro Integrated Bit Error Ratio Tester (IBERT) core for Virtex®-6 FPGA GTH transceivers is a customizable…
The LogiCORE In-System IBERT IP enables 2D eye scans of Ultrascale™/Ultrascale+™ transceivers to be performed the in Vivado® Seri…
ChipScope Pro (IBERT) for Virtex-6 GTH
The LogiCORE™ ChipScope™ Pro Integrated Bit Error Ratio Tester (IBERT) core for Virtex®-6 FPGA GTH transceivers is a customizable…
IBERT for UltraScale GTY Transceivers
The customizable LogiCORE™ IP Integrated Bit Error Ratio Tester (IBERT) core for UltraScale™ architecture GTY transceivers is des…
IBERT for UltraScale GTH Transceivers
The customizable LogiCORE™ IP Integrated Bit Error Ratio Tester (IBERT) core for UltraScale architecture GTH transceivers is desi…
IBERT for 7 Series GTZ Transceivers
The customizable LogiCORE™ IP Integrated Bit Error Ratio Test (IBERT) core for 7 series FPGA GTZ transceivers is designed for eva…
ChipScope Pro IBERT for 7 Series GTZ
The customizable LogiCORE™ IP ChipScope™ Pro Integrated Bit Error Ratio Test (IBERT) core for 7 series FPGA GTZ transceivers is d…
ChipScope Pro IBERT for 7 Series GTP
The customizable LogiCORE™ IP ChipScope™ Pro Integrated Bit Error Ratio Test (IBERT) core for 7 series FPGA GTP transceivers is d…
IBERT for 7 Series GTX Transceivers
The customizable LogiCORE™ IP Integrated Bit Error Ratio Test (IBERT) core for 7 series FPGA GTX transceivers is designed for eva…
IBERT for 7 Series GTP Transceivers
The customizable LogiCORE™ IP Integrated Bit Error Ratio Test (IBERT) core for 7 series FPGA GTP transceivers is designed for eva…
IBERT for 7 Series GTH Transceivers
The customizable LogiCORE™ IP Integrated Bit Error Ratio Test (IBERT) core for 7 series FPGA GTH transceivers is designed for eva…
ChipScope Pro IBERT for 7 Series GTX
The ChipScope™ Pro Integrated Bit Error Ratio Tester (IBERT) core for Kintex®-7 FPGA GTX transceivers is a customizable core that…