How to design 65nm FPGA DDR2 memory interfaces for signal integrity
By David Banas, Xilinx
January 24, 2007 -- pldesignline.com
Practical techniques for "correctness by design" in DDR2 interfaces, from a signal integrity (SI) perspective; follow these guidelines to make your next 65nm FPGA design a success.
This article presents practical techniques for incorporating "correctness by design" in DDR2 interfaces, from a Signal Integrity (SI) perspective, using the current generation of available design tools. Some common DDR2 design errors are analyzed, as well as the tradeoffs between some popular design alternatives.
January 24, 2007 -- pldesignline.com
Practical techniques for "correctness by design" in DDR2 interfaces, from a signal integrity (SI) perspective; follow these guidelines to make your next 65nm FPGA design a success.
This article presents practical techniques for incorporating "correctness by design" in DDR2 interfaces, from a Signal Integrity (SI) perspective, using the current generation of available design tools. Some common DDR2 design errors are analyzed, as well as the tradeoffs between some popular design alternatives.
To read the full article, click here
Related Semiconductor IP
- Zigbee Transceiver PHY
- Data Flow Architecture IP
- AMBA SPI Controller MRAM Controller
- Ethernet MAC
- Protocol Bridges
Related Articles
- How to design secure SoCs Part IV: Runtime Integrity Protection
- Si-GT: Fast Interconnect Signal Integrity Analysis For Integrated Circuit Design Via Graph Transformers
- Meeting signal integrity requirements in FPGAs with high-end memory interfaces
- Memory Design Considerations When Migrating to DDR3 Interfaces from DDR2
Latest Articles
- A Low-Latency ASIC Architecture for Real-Time Line Segment Detection
- BitFair: A 12nm Bit-Serial CNN Accelerator with Learnable Early Termination and Adaptive Bit Ordering for Ultra-Low-Power XR Vision
- A Flexible Sparsity-Aware FPGA Accelerator with Column-Wise Compression for Efficient CNN Inference
- Reducing Instruction-Fetch Energy in RISC-V for Embedded AI Processing via Dynamic and Static Loop Caching
- SPARC: Automated Root-Cause Analysis of Pre-Silicon Power Side-Channel Leakage in the Processor Design Flow