Test Your Way to a Better IoT
Better design and test procedures will lead to much lower maintenance costs than for systems where those precautions have not been taken.
The Internet of Things (IoT) promises a lot. By providing simple sensor and actuator nodes with both local intelligence and access to compute resources spread across the network, it promises to provide the infrastructure not just for smarter systems but systems of systems. Simply by adding new software and compute power, it will be possible to deploy additional services without having to change the things themselves.
But with such power comes a greater responsibility. Week after week of announcements of successful hacks -- an increasing number of which are focused on embedded systems and other things at the edge of the network -- underline how important security is to this new generation of devices. And they need to be able to ensure resilience under other problems, such as failing sensors, applications failing to access them correctly or errors in the data they are passed.
To read the full article, click here
Related Semiconductor IP
- Mesochronous Bridge for PCIe/CXL
- AI-native GPU
- OpenGMSL Verification IP
- OpenGMSL Leaf IP
- FlexGen Multi-Die Smart Network-on-Chip (NoC) IP
Related Blogs
- A CHERI on Top: A Better Way to Build Embedded Secure SoCs
- Three Smart Steps to Quickly Test a Register Map for Your Entire SoC
- Six ways to re-use mobile security practices in your next IoT project
- Emulation: Have It Your Way
Latest Blogs
- Automated, Faster Specification to Sign-Off with IDS-AI
- NovaTech Automation Crius PIU: Bringing Conventional Instrument Transformers onto the IEC 61850 Process Bus
- Single Pair Ethernet and TSN: The In-Robot Network Behind the Next Humanoid Robots
- A design path to success exists for ultra-low-voltage SoCs
- Where Routine Flow Ends Veriest Formal Expertise Begins