LogicVision and GDA Technologies Partner to Deliver LogicVision's Unique High Speed I/O Test IP

Design Automation Conference (DAC), San Francisco, Calif.— July 26, 2006 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of test and yield learning capabilities and GDA Technologies, Inc, a leading supplier of Intellectual Property (IP) and Electronic Design Services (EDS), today announced an alliance to deliver design services for high speed I/O test with LogicVision’s comprehensive at-speed test IP for high speed serializer/deserializer (SerDes) circuits.

The dynamic growth of these high-speed interface circuits and the rapid increase in both data rates and lane counts have created a need for a low cost parametric test for applications that include PCI Express, Ethernet, SATA and a number of other high-speed serial I/O standards. To meet this growing need GDA Technologies is collaborating with LogicVision to offer its customers built in self test (BIST) solutions for testing high speed I/O with LogicVision’s ETSerdes product. This service provides System-on-Chip design teams a high-quality IP solution for developing and testing high speed I/O circuits while reducing overall test cost.

Using LogicVision’s ETSerdes, a full set of high-speed I/O parametric tests can be performed at production test speeds. These tests included at-speed waveform tests, transmitter jitter tests, and receiver jitter tolerance tests. Because ETSerdes is on-chip, it can provide sub-picosecond performance at wafer probe, package, board and system test.

“The rapid growth in use of high-speed SerDes I/O devices is reflected in the demand from our customers for this technology,” said Ravi Thummarukudy, VP& GM of GDA's IC Solutions Business Unit. “We are pleased to offer our customers design services with LogicVision’s ETSerdes, to allow them to meet their performance and quality goals while containing manufacturing test costs.”

“GDA is a leading provider of PCI Express IP solution development, and believes that high speed signal integrity is critical for their customers,” said Jim Healy, president and CEO of LogicVision. ”LogicVision’s products deliver the high quality test needed, while reducing test costs. This is a compelling value proposition for customers who want to gain the benefits of SerDes BIST as inserted by a best-in-class design house.”

LogicVision, Inc. provides unique yield learning capabilities in the design for manufacturing space. These capabilities enable its customers, leading semiconductor companies, to more quickly and efficiently learn to improve product yields. The company’s advanced Design for Test (DFT) product line, ETCreate, works together with ETAccess and SiVision yield learning applications to improve profit margins by reducing device field returns, reducing test costs, and accelerating both time to market and time to yield. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. LogicVision was founded in 1992 and is headquartered in San Jose, Calif. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.