Industry Leaders Discuss "Overcoming the Challenges of Multi-die Systems Verification"
Lauro Rizzatti, hardware-assisted verification consultant, served as moderator for a well-attended and lively 2024 DVCon U.S. panel discussion on the challenges in multi-die systems verification.
The hour-long session featured panelists Alex Starr, AMD Corporate Fellow; Bharat Vinta, Director of HW Engineering at Nvidia; Divyang Agrawal, Sr. Director of RISC-V Cores at Tenstorrent; and Arturo Salz, Synopsys Fellow.
What follows is a shortened panel transcript, edited for readability.
To read the full article, click here
Related Semiconductor IP
- Ultra Ethernet MAC & PCS 100G/200G/400G/800G
- Ethernet PCS 100G/200G/400G/800G/1.6T
- Ethernet MAC 100G/200G/400G/800G/1.6T
- Junction Over-Temperature Detector with Linear Centigrade-to-Voltage Output - X-FAB XT018
- Performance P570 Gen 3
Related Blogs
- Industry Leaders Discuss "Overcoming the Challenges of Multi-die Systems Verification"
- Overcoming USB Type-C Verification Challenges
- NAND Flash Memory - Key Element For Your Multi-Die Systems Verification - Part 1
- Can the Semiconductor Industry Overcome Thermal Design Challenges in Multi-Die Systems?
Latest Blogs
- Inside the SiFive Performance™ P570 Gen 3: High Performance Efficiency for Next-Generation Consumer and Commercial Applications
- What the steam engine can teach us about modern chip design
- Automotive silicon in the era of AI, functional safety, and cybersecurity
- JPEG XS Officially Joins GenICam, The Machine Vision Standard Managed By EMVA
- Beyond PCIe Compliance: Why Stress Testing Is Crucial for Edge AI Deployments