Overview
ADC0401X is a 1.2-V/0.75-V dual supply voltage 16-channel 12-bit Analog-to-Digital Converter (ADC) that supports conversion rate (FS) up to 1 MS/s, designed in 4-nm CMOS FinFET process. It consists of a 16-to-1 analog input mux, a Successive Approximation Register (SAR) type monolithic ADC, a clock generator, and level shifters for low-voltage digital interface.
ADC0401X converts an analog input signal to 12-bit digital output codes, providing an on-chip sample-and-hold control and power-down control. The input range is typically 0 V to 1.2 V. The 16-to-1 analog input mux selects one of the 16 analog input channels to be sampled and converted. The power consumption of ADC0401X in normal operation mode is 0.5 mW at 1 MS/s.
The ADC0401X operates with two input clocks: main operation clock (CLK) and sampling clock (SOC). The frequencies of CLK and SOC are 20 MHz with 50% duty cycle and 1 MHz with 30% duty cycle, respectively. ADC0401X is suitable for mobile application processor, battery checker, portable equipment, and low-power applications.
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This paper introduces a novel closed-loop testing methodology for efficient linearity testing of high-resolution Successive Approximation Register (SAR) Analog-to-Digital Converters (ADCs). Existing test strategies, including histogram-based approaches, sine wave testing, and model-driven reconstruction, often rely on dense data acquisition followed by offline post-processing, which increases overall test time and complexity.
Analog to digital converters have three key input ports along with data output ports as per digital resolution requirements. These inputs ports are Analog Signal, Reference and Clock. If we compare across most of the converter architectures then clock frequency is directly related to output data rate and latency of the data conversion.
The growing availability of digital ICs like microcontrollers, microprocessors, and field-programmable gate arrays (FPGAs) allows developers to use complex digital processing techniques rather than analog signal conditioning. For this reason, analog-to-digital converters (ADCs) have become a widely-used component in mixed-signal circuits.
In high end RF systems, such as 5G radios, the requirements are so stringent that the source of this strongest unwanted tone can be the PLL. This article outlines how spurs in the input clock to the ADC or DAC may limit the SFDR. This in turn will set the requirements for the spurs for the input clock (from a PLL), in order to achieve a specific SFDR.
Power-sensitive applications such as Internet-of-Things (IoT) require a comprehensive power savings strategy within the system-on-chip (SoC). Techniques relying solely on the use of traditional power down modes and low supply voltage may not be enough to achieve the required power targets. The analog block is often assumed to be too sensitive and not compatible with aggressive power management techniques.
When continuously running a high speed ADC, it can be a challenge to deal with the firehose of raw data available at the output. To use City Semiconductor’s 2.5 GS/s 12-bit ADC, for example, 30 gigabits per second of data have to be accepted.
