TES is extending its on-chip sensor IP portfolio
May 14, 2026 -- TES Electronic Solutions GmbH expands its on-chip sensor IP portfolio by offering new linear temperature sensor and over-temperature detector IPs implemented in X-FAB XT018 - 0.18µm BCD-on-SOI technology. The sensors are suitable for complex system-on-chip packages where power density increases and thermal control and management is required. The following IPs are now available:
Linear Temperature Sensor generating an output voltage which is linearly increasing with junction temperature and trimmable to 2V at 60°C- Over-Temperature Detector A hysteresis detector that asserts output OVERTJ once junction temperature exceeds 147°C and subsequently stays above 138°C
Both IP cores show robustness and high reliability as their minimum continuous operation lifetime is 100,000 hours, making them suitable for automotive, industrial, and consumer electronics where long-term stability is primary.
Explore Sensor & Monitor IP:
- Linear Temperature Sensor
- Junction Over-Temperature Detector with Linear Centigrade-to-Voltage Output - X-FAB XT018
Related Semiconductor IP
- Linear Temperature Sensor
- Junction Over-Temperature Detector with Linear Centigrade-to-Voltage Output - X-FAB XT018
- High Speed Access & Test IP USB Version
- High Speed Access & Test IP PCIE Version
- SDI Verification IP
Related News
- TES is extending its PMU IP portfolio for X-FAB’s XT018 - 0.18µm BCD-on-SOI technology.
- TES Unveils High-Performance 8/40MHz Oscillator and Clock Buffer IPs for Reliable On-Chip Timing Solutions for X-FAB XT018 - 0.18µm BCD-on-SOI technology
- TES offers a High-Frequency Synthesizer and Clock Generator IP for X-FAB XT018 - 0.18µm BCD-on-SOI technology
- TES is extending its PMU IP portfolio for X-FAB’s XT018 - 0.18µm BCD-on-SOI technology.
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